Patents by Inventor Victor Selvaraj

Victor Selvaraj has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10959111
    Abstract: Systems, apparatuses, and methods for implementing enhanced beamforming training procedures are disclosed. A system includes a transmitter communicating over a wireless link with a receiver. To maintain a high quality of transmission over the wireless link, the transmitter and receiver perform periodic beamforming training procedures to test the various sectors of the transmit and receive antennas. In a wide sector sweep procedure, the transmitter and receiver test wide sectors to find the best wide transmit and receive sectors for transferring data. Then in a narrow sector sweep procedure, narrow sectors within and/or adjacent to the best wide sectors are tested, to find the best narrow sectors. This reduces the amount of sectors that are tested during the enhanced beamforming training procedure by skipping those narrow sectors that are far away from the best wide sectors.
    Type: Grant
    Filed: February 28, 2019
    Date of Patent: March 23, 2021
    Assignee: Advanced Micro Devices, Inc.
    Inventors: David Robert Stark, Jr., John Zhong-Chen Li, Carson Ryley Reece Green, Victor Selvaraj
  • Publication number: 20200280862
    Abstract: Systems, apparatuses, and methods for implementing enhanced beamforming training procedures are disclosed. A system includes a transmitter communicating over a wireless link with a receiver. To maintain a high quality of transmission over the wireless link, the transmitter and receiver perform periodic beamforming training procedures to test the various sectors of the transmit and receive antennas. In a wide sector sweep procedure, the transmitter and receiver test wide sectors to find the best wide transmit and receive sectors for transferring data. Then in a narrow sector sweep procedure, narrow sectors within and/or adjacent to the best wide sectors are tested, to find the best narrow sectors. This reduces the amount of sectors that are tested during the enhanced beamforming training procedure by skipping those narrow sectors that are far away from the best wide sectors.
    Type: Application
    Filed: February 28, 2019
    Publication date: September 3, 2020
    Inventors: David Robert Stark, Jr., John Zhong-Chen Li, Carson Ryley Reece Green, Victor Selvaraj
  • Publication number: 20130022502
    Abstract: Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof.
    Type: Application
    Filed: September 18, 2012
    Publication date: January 24, 2013
    Inventors: Wayne D. Roth, Charles J. Collins, William R. Deicher, Jarden E. Krager, Adam R. Schilffarth, Ross G. Johnson, Colin D. Bozarth, Victor Selvaraj, Nicolas F. Arab, Bruce J.C. Barnard, Donald A. Conner, Robert S. Roach, Edward A. Calvin, Eric D. Smith, David L. Smith
  • Patent number: 8296088
    Abstract: Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof.
    Type: Grant
    Filed: May 17, 2010
    Date of Patent: October 23, 2012
    Assignee: Luminex Corporation
    Inventors: Wayne D. Roth, Charles J. Collins, William R. Deicher, Jarden E. Krager, Adam R. Schilffarth, Ross G. Johnson, Colin D. Bozarth, Victor Selvaraj, Nicolas F. Arab, Bruce J. C. Bernard, Donald A. Conner, Robert S. Roach
  • Publication number: 20100228513
    Abstract: Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof.
    Type: Application
    Filed: May 17, 2010
    Publication date: September 9, 2010
    Applicant: LUMINEX CORPORATION
    Inventors: Wayne D. Roth, Edward A. Calvin, Charles J. Collins, William R. Deicher, Jarden E. Krager, Adam R. Schilffarth, Ross G. Johnson, Colin D. Bozarth, Victor Selvaraj, Eric D. Smith, Nicolas F. Arab, Bruce J.C. Bernard, Donald A. Conner, Robert S. Roach, David L. Smith