Patents by Inventor Vignesh Ravichandran

Vignesh Ravichandran has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250124267
    Abstract: The disclosed computer-implemented method includes normalizing tabular data corresponding to a query target, and inputting the normalized tabular data into a shallow neural network corresponding to a fully-connected three-layer model comprising an input layer, a hidden layer, and an output layer. Normalizing the tabular data may replace feature detection for the shallow neural network. The method may further include predicting a plurality of classifications for the query target, wherein a plurality of nodes of the output layer respectively correspond to the plurality of classifications. Various other methods, systems, and computer-readable media are also disclosed.
    Type: Application
    Filed: December 4, 2023
    Publication date: April 17, 2025
    Inventors: Satyabrata Mishra, Vignesh Ravichandran
  • Patent number: 10514890
    Abstract: An optimized test data selection strategy references a sampling file that identifies data attributes that serve as the basis of the test data selection strategy. By analyzing fields and the corresponding field values of the sample imprint, a total number of test data selected for inclusion into a sample dataset is reduced. The test data selection strategy provides an efficient methodology for implementing a data comparison testing process.
    Type: Grant
    Filed: November 15, 2017
    Date of Patent: December 24, 2019
    Assignee: Accenture Global Solutions Limited
    Inventors: Ajay Mody, Brad A. Gonnerman, Matthew Ngai, Vignesh Ravichandran, Frederick S. Siy, Vikram Jugal Godani
  • Publication number: 20190146755
    Abstract: An optimized test data selection strategy references a sampling file that identifies data attributes that serve as the basis of the test data selection strategy. By analyzing fields and the corresponding field values of the sample imprint, a total number of test data selected for inclusion into a sample dataset is reduced. The test data selection strategy provides an efficient methodology for implementing a data comparison testing process.
    Type: Application
    Filed: November 15, 2017
    Publication date: May 16, 2019
    Applicant: Accenture Global Solutions Limited
    Inventors: Ajay Mody, Brad A. Gonnerman, Matthew Ngai, Vignesh Ravichandran, Frederick S. Siy, Vikram Jugal Godani