Abstract: Aspects of the disclosure provide a method including determining a measurement configuration for one or more piezoelectric devices in an electronic apparatus. The electronic apparatus includes an electronic device mounted on a substrate block using a bonding layer. The one or more piezoelectric devices including a first subset and a second subset are attached to one of the electronic device and the bonding layer. The method includes performing, based on the measurement configuration, a defect measurement on the electronic apparatus by causing the first subset to transmit and the second subset to receive one or more acoustic signals. The method includes determining whether at least one mechanical defect is located in at least one of (i) the bonding layer, (ii) the electronic device, (iii) the substrate block, (iv) interfaces of the electronic device, the bonding layer, and the substrate block based on the received one or more acoustic signals.

Abstract: An electronics system may include a substrate, an electronic device bonded to the substrate, a plurality of photoluminescent particles disposed on the electronic device, an illuminator, a sensor, and a control module. The illuminator can illuminate the electronic device. The sensor can capture a first set of positions of the photoluminescent particles on the electronic device when the electronic device is not operating under a load and a second set of positions of the photoluminescent particles when the electronic device is operating under a load. The control module can determine thermomechanical stress on the electronic device based at least in part on a difference between the first set of positions and the second set of positions.

Abstract: Aspects of the disclosure provide a method including determining a measurement configuration for one or more piezoelectric devices in an electronic apparatus. The electronic apparatus includes an electronic device mounted on a substrate block using a bonding layer. The one or more piezoelectric devices including a first subset and a second subset are attached to one of the electronic device and the bonding layer. The method includes performing, based on the measurement configuration, a defect measurement on the electronic apparatus by causing the first subset to transmit and the second subset to receive one or more acoustic signals. The method includes determining whether at least one mechanical defect is located in at least one of (i) the bonding layer, (ii) the electronic device, (iii) the substrate block, (iv) interfaces of the electronic device, the bonding layer, and the substrate block based on the received one or more acoustic signals.

Abstract: A method of detecting sub-surface voids in a sample comprises positioning a probe adjacent to a first point on the sample, emitting an ultrasonic wave from the probe towards the sample, moving the probe towards the sample, measuring a shear force amplitude of a reflection of the ultrasonic wave at the probe as the probe moves towards the sample, creating an approach curve by plotting the measured shear force amplitude of the reflection of the ultrasonic wave as a function of a distance between the probe and the sample, and determining whether a sub-surface void exists at the first point on the sample based on a slope of the approach curve.

Abstract: A method of detecting sub-surface voids in a sample comprises positioning a probe adjacent to a first point on the sample, emitting an ultrasonic wave from the probe towards the sample, moving the probe towards the sample, measuring a shear force amplitude of a reflection of the ultrasonic wave at the probe as the probe moves towards the sample, creating an approach curve by plotting the measured shear force amplitude of the reflection of the ultrasonic wave as a function of a distance between the probe and the sample, and determining whether a sub-surface void exists at the first point on the sample based on a slope of the approach curve.

Abstract: An electronics system may include a substrate, an electronic device bonded to the substrate, a plurality of photoluminescent particles disposed on the electronic device, an illuminator, a sensor, and a control module. The illuminator can illuminate the electronic device. The sensor can capture a first set of positions of the photoluminescent particles on the electronic device when the electronic device is not operating under a load and a second set of positions of the photoluminescent particles when the electronic device is operating under a load. The control module can determine thermomechanical stress on the electronic device based at least in part on a difference between the first set of positions and the second set of positions.

Abstract: A method and apparatus for generating touch blob angle orientation in a touch device are described. In one embodiment, the apparatus comprises a touch processing unit operable to analyze sensor data generated from touch inputs on a touchscreen and generate touch blob information for each detected touch blob; and a filter coupled to the touch processing unit operable to filter blob orientation information from a filter output in response to detection of a finger lifting event.

Abstract: A method and apparatus for generating touch blob angle orientation in a touch device are described. In one embodiment, the apparatus comprises a touch processing unit operable to analyze sensor data generated from touch inputs on a touchscreen and generate touch blob information for each detected touch blob; and a filter coupled to the touch processing unit operable to filter blob orientation information from a filter output in response to detection of a finger lifting event.

Abstract: A processing system for an input device having a sensing region overlapping an input surface and an array of sensor electrodes configured to form a plurality of proximity pixels and a plurality of force pixels. The processing system is configured to: determine a proximity image indicative of positional information for input objects; determine a force image indicative of local deflection of the input surface in response to force applied by the input objects; determine a respective group of proximity pixels from the proximity image corresponding to each input object; determine a respective group of force pixels from the force image corresponding to each determined group of proximity pixels; determine the position of each input object based on the determined groups of proximity pixels; and determine the force associated with each input object based on the determined groups of force pixels.

Abstract: A method for face detection management includes determining, for a first time, a presence of an input object in a sensing region of a capacitance input device. The presence is determined for the first time using a first baseline, and the input object satisfies a size threshold. The method further includes suppressing a reporting of capacitance input device during a predefined time period based on the presence of the input object, determining a disabled state of a display of a host, wherein the disabled state is in response to determining the presence of the input object for the first time, and determining, in response to an elapse of the predefined time period and for a second time, an absence of the input object in the sensing region. The absence of the input object is determined for the second time using a second baseline to account for the disabled state of the display. The method further includes performing an action based on determining the absence of the input object.

Abstract: A processing system for an input device having a sensing region overlapping an input surface and an array of sensor electrodes configured to form a plurality of proximity pixels and a plurality of force pixels. The processing system is configured to: determine a proximity image indicative of positional information for input objects; determine a force image indicative of local deflection of the input surface in response to force applied by the input objects; determine a respective group of proximity pixels from the proximity image corresponding to each input object; determine a respective group of force pixels from the force image corresponding to each determined group of proximity pixels; determine the position of each input object based on the determined groups of proximity pixels; and determine the force associated with each input object based on the determined groups of force pixels.

Abstract: A method for face detection management includes determining, for a first time, a presence of an input object in a sensing region of a capacitance input device. The presence is determined for the first time using a first baseline, and the input object satisfies a size threshold. The method further includes suppressing a reporting of capacitance input device during a predefined time period based on the presence of the input object, determining a disabled state of a display of a host, wherein the disabled state is in response to determining the presence of the input object for the first time, and determining, in response to an elapse of the predefined time period and for a second time, an absence of the input object in the sensing region. The absence of the input object is determined for the second time using a second baseline to account for the disabled state of the display. The method further includes performing an action based on determining the absence of the input object.

Abstract: A processing system for an input device having a sensing region overlapping an input surface and an array of sensor electrodes configured to form a plurality of proximity pixels and a plurality of force pixels. The processing system is configured to: determine a proximity image indicative of positional information for input objects; determine a force image indicative of local deflection of the input surface in response to force applied by the input objects; determine a respective group of proximity pixels from the proximity image corresponding to each input object; determine a respective group of force pixels from the force image corresponding to each determined group of proximity pixels; determine the position of each input object based on the determined groups of proximity pixels; and determine the force associated with each input object based on the determined groups of force pixels.

Abstract: A processing system for an input device having a sensing region overlapping an input surface and an array of sensor electrodes configured to form a plurality of proximity pixels and a plurality of force pixels. The processing system is configured to: determine a proximity image indicative of positional information for input objects; determine a force image indicative of local deflection of the input surface in response to force applied by the input objects; determine a respective group of proximity pixels from the proximity image corresponding to each input object; determine a respective group of force pixels from the force image corresponding to each determined group of proximity pixels; determine the position of each input object based on the determined groups of proximity pixels; and determine the force associated with each input object based on the determined groups of force pixels.

Abstract: Methods, systems and devices are described for determining positional information for objects using an input device. The various embodiments provide improved user interface functionality by facilitating user input with input objects that are at the surface and objects that are away from the surface. The input device includes a processing system and an array of sensor electrodes adapted to capacitively sense objects in a sensing region. The processing system is configured to determine first positional information for an input object in a first portion of the sensing region based on a difference between a first frame of the first plurality of frames and a filtered frame even when the input object is determined to be in the sensing region when the first plurality of frames are acquired, wherein the filtered frame is based on one or more of the first plurality of frames.

Abstract: Methods, systems and devices are described for determining positional information for objects using an input device. The various embodiments provide improved user interface functionality by facilitating user input with input objects that are at the surface and objects that are away from the surface. The input device includes a processing system and an array of sensor electrodes adapted to capacitively sense objects in a sensing region.