Abstract: A load current compensating output buffer circuit and method are disclosed. The circuit includes a buffer amplifier coupled to a supply voltage and the inverting input receives an input voltage and the non-inverting input couples to an output capacitive load. A feedback impedance with a variable resistance circuit and a Miller capacitance in series is coupled to an output of the buffer amplifier and the capacitive load. A pass transistor couples to the supply voltage and the output capacitive load, the pass transistor having a gate terminal coupled to the output of the output buffer amplifier and the feedback impedance, a load current passing through the pass transistor. A sense circuit is configured to sense the load current and apply a control voltage to the variable resistance circuit to vary the resistance of the variable resistance circuit based on the load current.

Abstract: A load current compensating output buffer circuit and method are disclosed. The circuit includes a buffer amplifier coupled to a supply voltage and the inverting input receives an input voltage and the non-inverting input couples to an output capacitive load. A feedback impedance with a variable resistance circuit and a Miller capacitance in series is coupled to an output of the buffer amplifier and the capacitive load. A pass transistor couples to the supply voltage and the output capacitive load, the pass transistor having a gate terminal coupled to the output of the output buffer amplifier and the feedback impedance, a load current passing through the pass transistor. A sense circuit is configured to sense the load current and apply a control voltage to the variable resistance circuit to vary the resistance of the variable resistance circuit based on the load current.

Abstract: A low-noise amplifier (LNA) includes a pair of transistors connected in a cascode configuration to provide amplification to an input signal. The LNA generates an amplified output in differential form across a pair of output terminals. One of the pair of output terminals is the output node of the cascode configuration. The LNA further includes a feedback transistor with its gate terminal connected to the output node of the cascode configuration and its drain terminal connected to the other one of the pair of output terminals. The differential nature of the amplified output reduces the noise figure of the LNA. A frequency-selective network connected across the pair of output terminals sets the frequency selectivity of each of the input section and the output section of the LNA.

Abstract: In an apparatus and method for monitoring defects in wafers, a monitoring circuit is fabricated on an area of each one of the wafers. The monitoring circuit includes representative devices that replicate similar devices located in a die area of the wafers. Defects if present in the representative devices contribute to a generation of a noise, thereby causing an imbalance in a differential signal measurable across selected ones of the representative devices. A digitizing circuit that uses a common mode voltage as a reference to measure the imbalance digitizes the differential signal to a digital signal, the digital signal being indicative of the noise generated by the defects. The digital signal is stored over a configurable time interval to form a digital bit stream. The digital bit stream is compared to a reference to determine whether the defeats are within an allowable range.

Abstract: In an apparatus and method for monitoring defects in wafers, a monitoring circuit is fabricated on an area of each one of the wafers. The monitoring circuit includes representative devices that replicate similar devices located in a die area of the wafers. Defects if present in the representative devices contribute to a generation of a noise, thereby causing an imbalance in a differential signal measurable across selected ones of the representative devices. A digitizing circuit that uses a common mode voltage as a reference to measure the imbalance digitizes the differential signal to a digital signal, the digital signal being indicative of the noise generated by the defects. The digital signal is stored over a configurable time interval to form a digital bit stream. The digital bit stream is compared to a reference to determine whether the defeats are within an allowable range.

Abstract: In an apparatus and method for monitoring defects in wafers, a monitoring circuit is fabricated on an area of each one of the wafers. The monitoring circuit includes representative devices that replicate similar devices located in a die area of the wafers. Defects if present in the representative devices contribute to a generation of a noise, thereby causing an imbalance in a differential signal measurable across selected ones of the representative devices. A digitizing circuit that uses a common mode voltage as a reference to measure the imbalance digitizes the differential signal to a digital signal, the digital signal being indicative of the noise generated by the defects. The digital signal is stored over a configurable time interval to form a digital bit stream. The digital bit stream is compared to a reference to determine whether the defects are within an allowable range.

Abstract: In an apparatus and method for monitoring defects in wafers, a monitoring circuit is fabricated on an area of each one of the wafers. The monitoring circuit includes representative devices that replicate similar devices located in a die area of the wafers. Defects if present in the representative devices contribute to a generation of a noise, thereby causing an imbalance in a differential signal measurable across selected ones of the representative devices. A digitizing circuit that uses a common mode voltage as a reference to measure the imbalance digitizes the differential signal to a digital signal, the digital signal being indicative of the noise generated by the defects. The digital signal is stored over a configurable time interval to form a digital bit stream. The digital bit stream is compared to a reference to determine whether the defects are within an allowable range.