Patents by Inventor Vijayananda JAGANNATHA

Vijayananda JAGANNATHA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240118360
    Abstract: Proposed concepts thus aim to provide schemes, solutions, concept, designs, methods and systems pertaining to updating a magnetic field (B0) map of a subject during a magnetic resonance imaging (MRI) examination or during image reconstruction. In particular, when a subject moves, the magnetic field inside the magnetic bore changes. As a result, any B0 map obtained prior to the movement of the subject may be inaccurate. Accordingly, an initial B0 map is updated to reflect changes in the B0 map caused by the movement of the subject. This can be achieved by determining a B0 map of the subject based on a B0 prediction model, instead of spending additional scanning time to acquire another B0 map.
    Type: Application
    Filed: December 29, 2021
    Publication date: April 11, 2024
    Inventors: Vidya MS, Umesh Suryanarayana Rudrapatna, Vijayananda Jagannatha, Ashvin Srinivasan, Jaladhar Neelavalli, Sharun S Thazhackal, Suja Saraswathy
  • Publication number: 20230334656
    Abstract: Disclosed herein is a method and system for identifying abnormal images in a set of medical images for optimal assessment of the medical images. A plurality of global features from each medical image is extracted based on pretrained weights associated with each global feature. Similarly, plurality of local features from each medical image is extracted analyzing a predefined number of image patches generated from a higher resolution image corresponding to each medical image. Further, an abnormality score for each medical image is determined based on weights associated with a combined feature set obtained by concatenating the plurality of global features and the plurality of local features. Thereafter, the medical image is identified as an abnormal image when the abnormality score of the medical image is higher than a predefined first threshold score.
    Type: Application
    Filed: May 3, 2021
    Publication date: October 19, 2023
    Inventors: Vidya Madapusi Srinivas PRASAD, Srinivasa Rao KUNDETI, Manikanda Krishnan V, Vijayananda JAGANNATHA
  • Patent number: 11532391
    Abstract: Systems and methods are disclosed for generating device test cases for medical imaging devices, which are not only reflective of current actual field usage of the device but also provide outlook on future usage. A probabilistic model of usage patterns is generated from historic data present in the device field logs by mining the current usage patterns. A Deep Long Short Term Memory Neural Network model of the usage patterns is constructed to predict the future usage patterns. Additionally, to capture the changing trends of device usage patterns in the field, predictive models are continuously updated in real time, and the test cases generated log files by the models are integrated into an automated testing system.
    Type: Grant
    Filed: October 3, 2018
    Date of Patent: December 20, 2022
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Vijayananda Jagannatha, Vinay Pandit, Srinivas Prasad Madapusi Raghavan, Rupesh Vakkachi Kandi
  • Publication number: 20200265944
    Abstract: Systems and methods are disclosed for generating device test cases for medical imaging devices, which are not only reflective of current actual field usage of the device but also provide outlook on future usage. A probabilistic model of usage patterns is generated from historic data present in the device field logs by mining the current usage patterns. A Deep Long Short Term Memory Neural Network model of the usage patterns is constructed to predict the future usage patterns. Additionally, to capture the changing trends of device usage patterns in the field, predictive models are continuously updated in real time, and the test cases generated log files by the models are integrated into an automated testing system.
    Type: Application
    Filed: October 3, 2018
    Publication date: August 20, 2020
    Inventors: Vijayananda JAGANNATHA, Vinay PANDIT, Srinivas Prasad MADAPUSI RAGHAVAN, Rupesh VAKKACHI KANDI