Abstract: Aspects of data management are described. Information for updating a cluster of storage nodes to a second version may be obtained. Based on obtaining the information, a cluster-level precheck procedure may be performed prior to initiating an update procedure for the cluster of storage nodes. Also, during the update procedure, a node-level precheck procedure may be performed prior to initiating an update of a storage node to determine whether the storage node is in a state for successful update. Based on a result of the node-level precheck, a determination of whether to delay the update of the storage node may be made.

Abstract: A standard cell for a semiconductor device has first and second opposing boundaries and third and fourth opposite boundaries, and includes first and second active regions formed in a semiconductor substrate. The first and second active regions are a first predetermined distance (a) from the first and second boundaries, respectively. A gate electrode is formed over the first and second active regions. First and second dummy diffusions layers are formed along the third boundary and are the first predetermined distance (a) from the first and second boundaries and a second predetermined distance (b) from the first and second active regions, respectively. Third and fourth dummy diffusions layers are formed along the fourth boundary and are the first predetermined distance (a) from the first and second boundaries and a third predetermined distance (b?) from the first and second active regions, respectively.