Patents by Inventor Vikram Mahidhar

Vikram Mahidhar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11410287
    Abstract: A method and system are provided for assessing damage to a structure. According to one embodiment, the method includes using a classifier that is trained to associate respective portions of in an image of a structure with respective external parts of the structure to detect several of external parts of a structure in a first image of the structure. The method also includes using a first machine learning system, trained to perform segmentation of an image, to identify one or more image segments in a second image, where each image segment represents damage of a particular type and, using a second machine learning system, trained to associate image segments with external parts identified in an image, to associate a first image segment with a first external part, indicating damage to the first external part.
    Type: Grant
    Filed: May 15, 2020
    Date of Patent: August 9, 2022
    Assignee: Genpact Luxembourg S.à r.l. II
    Inventors: Siva Tian, Krishna Dev Oruganty, Adrita Barari, Edmond Schneider, Nitish Kumar, Amit Arora, Vikram Mahidhar, Chirag Jain, Abhilash Nvs
  • Publication number: 20210142464
    Abstract: A method and system are provided for assessing damage to a structure. According to one embodiment, the method includes using a classifier that is trained to associate respective portions of in an image of a structure with respective external parts of the structure to detect several of external parts of a structure in a first image of the structure. The method also includes using a first machine learning system, trained to perform segmentation of an image, to identify one or more image segments in a second image, where each image segment represents damage of a particular type and, using a second machine learning system, trained to associate image segments with external parts identified in an image, to associate a first image segment with a first external part, indicating damage to the first external part.
    Type: Application
    Filed: May 15, 2020
    Publication date: May 13, 2021
    Applicant: Genpact Luxembourg S.à r.l
    Inventors: Siva Tian, Krishna Dev Oruganty, Adrita Barari, Edmond Schneider, Nitish Kumar, Amit Arora, Vikram Mahidhar, Chirag Jain, Abhilash Nvs