Patents by Inventor Vikram Shrowty

Vikram Shrowty has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9691027
    Abstract: Machine-learning based detection (MLD) profiles can be used to identify sensitive information in documents. The MLD profile can be used to generate a confidence value for the document that expresses the degree of confidence with which the MLD profile can classify the document as sensitive or not. In one embodiment, a data loss prevention system provides or suggests a confidence level threshold to a user of the data loss prevention system by providing a confidence level threshold for the MLD profile to the user, the confidence level threshold to be used as the boundary between sensitive data and non-sensitive data. In one embodiment the provided confidence level threshold is determined by scanning a random data set using the MLD profile.
    Type: Grant
    Filed: December 13, 2011
    Date of Patent: June 27, 2017
    Assignee: Symantec Corporation
    Inventors: Shitalkumar S. Sawant, Vikram Shrowty, Philip DiCorpo
  • Patent number: 8949371
    Abstract: A server system identifies structured data for protection and creates an index of the structured data, the index comprising a set of Bloom filters. The server system distributes the index to an endpoint device to enable the endpoint device to monitor for structured data occurring in free text data associated with the endpoint device. The endpoint device may load, from the index file, a set of Bloom filters into memory and identify free text data for monitoring. The endpoint device may then determine whether the free text data contains at least a portion of the structured data using the set of Bloom filters.
    Type: Grant
    Filed: September 29, 2011
    Date of Patent: February 3, 2015
    Assignee: Symantec Corporation
    Inventor: Vikram Shrowty
  • Patent number: 7260803
    Abstract: A method and system for performing dummy metal insertion in design data for an integrated circuit is disclosed, wherein the design data includes dummy metal objects inserted by a dummy fill tool. After a portion of the design data is changed, a check is performed to determine whether any dummy metal objects intersect with any other objects in the design data. If so, the intersecting dummy metal objects are deleted from the design data, thereby avoiding having to rerun the dummy fill tool.
    Type: Grant
    Filed: October 10, 2003
    Date of Patent: August 21, 2007
    Assignee: LSI Corporation
    Inventors: Viswanathan Lakshmanan, Richard Blinne, Vikram Shrowty, Lena Montecillo
  • Patent number: 7237218
    Abstract: The present invention optimizes the dynamic power characteristics of an integrated circuit (IC) chip. The IC chip includes a plurality of layers, wherein at least one of the layers is a power mesh layer that provides power to the IC chip, and includes a ground (Vss) net. The method includes providing at least one dummy metal mesh layer, and coupling the dummy metal mesh layer to the Vss net on the power mesh layer thereby increasing the capacitance on the Vss net.
    Type: Grant
    Filed: August 26, 2004
    Date of Patent: June 26, 2007
    Assignee: LSI Corporation
    Inventors: Vikram Shrowty, Santhanakris Raman
  • Patent number: 7174526
    Abstract: Generating a density abstraction view for an integrated circuit design by dividing each block in the design that is larger than a predetermined size into a grid of rectangles; calculating a sum of metal area in each rectangle in the grid; creating an object in each rectangle having an area equal to the metal area sum of the rectangle; and storing all the created objects for the block as a view. The view may be stored in a layout database along with any other views for the integrated circuit design, and then used to determine density of a tile overlapping with the block by adding the area of the square objects in the density view that overlap with the tile to the tile.
    Type: Grant
    Filed: July 30, 2004
    Date of Patent: February 6, 2007
    Assignee: LSI Logic Corporation
    Inventors: Vikram Shrowty, Santhanakrishnan Raman
  • Publication number: 20060046353
    Abstract: The present invention optimizes the dynamic power characteristics of an integrated circuit (IC) chip. The IC chip includes a plurality of layers, wherein at least one of the layers is a power mesh layer that provides power to the IC chip, and includes a ground (Vss) net. The method includes providing at least one dummy metal mesh layer, and coupling the dummy metal mesh layer to the Vss net on the power mesh layer thereby increasing the capacitance on the Vss net.
    Type: Application
    Filed: August 26, 2004
    Publication date: March 2, 2006
    Inventors: Vikram Shrowty, Santhanakris Raman
  • Patent number: 7007259
    Abstract: A method and system is disclosed for inserting dummy metal into a circuit design, which includes a plurality of objects and clock nets. Aspects of the invention include identifying free spaces on each layer of the chip design suitable for dummy metal insertion, wherein the free spaces are referred to as dummy regions. Thereafter, the dummy regions are prioritized such that the dummy regions located adjacent to clock nets are filled with dummy metal last. In a preferred embodiment, the dummy regions are further prioritized such that the dummy regions adjacent to wider clock nets are filled with dummy metal after dummy regions that are located adjacent to narrower clock nets.
    Type: Grant
    Filed: July 31, 2003
    Date of Patent: February 28, 2006
    Assignee: LSI Logic Corporation
    Inventors: Vikram Shrowty, Santhanakrishnan Raman
  • Publication number: 20060026551
    Abstract: Generating a density abstraction view for an integrated circuit design by dividing each block in the design that is larger than a predetermined size into a grid of rectangles; calculating a sum of metal area in each rectangle in the grid; creating an object in each rectangle having an area equal to the metal area sum of the rectangle; and storing all the created objects for the block as a view. The view may be stored in a layout database along with any other views for the integrated circuit design, and then used to determine density of a tile overlapping with the block by adding the area of the square objects in the density view that overlap with the tile to the tile.
    Type: Application
    Filed: July 30, 2004
    Publication date: February 2, 2006
    Inventors: Vikram Shrowty, Santhanakrishnan Raman
  • Publication number: 20050080607
    Abstract: A method and system for performing dummy metal insertion in design data for an integrated circuit is disclosed, wherein the design data includes dummy metal objects inserted by a dummy fill tool. After a portion of the design data is changed, a check is performed to determine whether any dummy metal objects intersect with any other objects in the design data. If so, the intersecting dummy metal objects are deleted from the design data, thereby avoiding having to rerun the dummy fill tool.
    Type: Application
    Filed: October 10, 2003
    Publication date: April 14, 2005
    Inventors: Viswanathan Lakshmanan, Richard Blinne, Vikram Shrowty, Lena Montecillo
  • Publication number: 20050028121
    Abstract: A method and system is disclosed for inserting dummy metal into a circuit design, which includes a plurality of objects and clock nets. Aspects of the invention include identifying free spaces on each layer of the chip design suitable for dummy metal insertion, wherein the free spaces are referred to as dummy regions. Thereafter, the dummy regions are prioritized such that the dummy regions located adjacent to clock nets are filled with dummy metal last. In a preferred embodiment, the dummy regions are further prioritized such that the dummy regions adjacent to wider clock nets are filled with dummy metal after dummy regions that are located adjacent to narrower clock nets.
    Type: Application
    Filed: July 31, 2003
    Publication date: February 3, 2005
    Inventors: Vikram Shrowty, Santhanakrishnan Raman
  • Patent number: 6757883
    Abstract: Free space on a routed IC is estimated using expanding hierarchical search quadtrees or octrees. Nodes defining rectangular spaces of a layer are created in the tree. Definitions of polygons representing occupied space in the rectangular space are subtracted from a free-space polygon based on the rectangular space. A cost factor is identified for the node, and the process repeats with additional feature polygons until either the cost factor exceeds a maximum or no further feature polygons exist in the layer. If the cost factor exceeds the limit, the node is fractured into child nodes, each defining a quadrant of the parent rectangular space and each containing polygon definitions from the parent node. The process repeats until either the cost factor for each node is not greater than the limit or a dimension of the rectangular space of the node reaches a selected minimum. The nodes define free spaces, which are summed to identify the free space on the IC layer.
    Type: Grant
    Filed: December 11, 2002
    Date of Patent: June 29, 2004
    Assignee: LSI Logic Corporation
    Inventors: Vikram Shrowty, Santhanakris Raman
  • Publication number: 20040117751
    Abstract: Free space on a routed IC is estimated using expanding hierarchical search quadtrees or octrees. Nodes defining rectangular spaces of a layer are created in the tree. Definitions of polygons representing occupied space in the rectangular space are subtracted from a free-space polygon based on the rectangular space. A cost factor is identified for the node, and the process repeats with additional feature polygons until either the cost factor exceeds a maximum or no further feature polygons exist in the layer. If the cost factor exceeds the limit, the node is fractured into child nodes, each defining a quadrant of the parent rectangular space and each containing polygon definitions from the parent node. The process repeats until either the cost factor for each node is not greater than the limit or a dimension of the rectangular space of the node reaches a selected minimum. The nodes define free spaces, which are summed to identify the free space on the IC layer.
    Type: Application
    Filed: December 11, 2002
    Publication date: June 17, 2004
    Inventors: Vikram Shrowty, Santhanakris Raman