Abstract: A method of misalignment correction in a structured light device is provided that includes extracting features from a first captured image of a scene, wherein the first captured image is captured by an imaging sensor component of the structured light device, and wherein the first captured image includes a pattern projected into the scene by a projector component of the structured light device, matching the features of the first captured image to predetermined features of a pattern image corresponding to the projected pattern to generate a dataset of matching features, determining values of alignment correction parameters of an image alignment transformation model using the dataset of matching features, and applying the image alignment transformation model to a second captured image using the determined alignment correction parameter values.