Patents by Inventor Vilmos Kertesz

Vilmos Kertesz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20100072394
    Abstract: An electrospray ion source and method of operation includes the application of pulsed voltage to prevent electrolysis of analytes with a low electrochemical potential. The electrospray ion source can include an emitter, a counter electrode, and a power supply. The emitter can include a liquid conduit, a primary working electrode having a liquid contacting surface, and a spray tip, where the liquid conduit and the working electrode are in liquid communication. The counter electrode can be proximate to, but separated from, the spray tip. The power system can supply voltage to the working electrode in the form of a pulse wave, where the pulse wave oscillates between at least an energized voltage and a relaxation voltage. The relaxation duration of the relaxation voltage can range from 1 millisecond to 35 milliseconds. The pulse duration of the energized voltage can be less than 1 millisecond and the frequency of the pulse wave can range from 30 to 800 Hz.
    Type: Application
    Filed: April 28, 2009
    Publication date: March 25, 2010
    Inventors: Vilmos Kertesz, Gary J. Van Berkel
  • Publication number: 20100002905
    Abstract: A system and method utilizes an image analysis approach for controlling the collection instrument-to-surface distance in a sampling system for use, for example, with mass spectrometric detection. Such an approach involves the capturing of an image of the collection instrument or the shadow thereof cast across the surface and the utilization of line average brightness (LAB) techniques to determine the actual distance between the collection instrument and the surface. The actual distance is subsequently compared to a target distance for re-optimization, as necessary, of the collection instrument-to-surface during an automated surface sampling operation.
    Type: Application
    Filed: July 2, 2008
    Publication date: January 7, 2010
    Inventors: Gary J. Van Berkel, Vilmos Kertesz
  • Publication number: 20100000338
    Abstract: A system and method utilizes distance-measuring equipment including a laser sensor for controlling the collection instrument-to-surface distance during a sample collection process for use, for example, with mass spectrometric detection. The laser sensor is arranged in a fixed positional relationship with the collection instrument, and a signal is generated by way of the laser sensor which corresponds to the actual distance between the laser sensor and the surface. The actual distance between the laser sensor and the surface is compared to a target distance between the laser sensor and the surface when the collection instrument is arranged at a desired distance from the surface for sample collecting purposes, and adjustments are made, if necessary, so that the actual distance approaches the target distance.
    Type: Application
    Filed: July 2, 2008
    Publication date: January 7, 2010
    Inventors: Gary J. Van Berkel, Vilmos Kertesz
  • Patent number: 7295026
    Abstract: A system and method utilizes an image analysis approach for controlling the probe-to-surface distance of a liquid junction-based surface sampling system for use with mass spectrometric detection. Such an approach enables a hands-free formation of the liquid microjunction used to sample solution composition from the surface and for re-optimization, as necessary, of the microjunction thickness during a surface scan to achieve a fully automated surface sampling system.
    Type: Grant
    Filed: June 3, 2005
    Date of Patent: November 13, 2007
    Assignee: UT-Battelle, LLC
    Inventors: Gary J. Van Berkel, Vilmos Kertesz, Michael James Ford
  • Publication number: 20060273808
    Abstract: A system and method utilizes an image analysis approach for controlling the probe-to-surface distance of a liquid junction-based surface sampling system for use with mass spectrometric detection. Such an approach enables a hands-free formation of the liquid microjunction used to sample solution composition from the surface and for re-optimization, as necessary, of the microjunction thickness during a surface scan to achieve a fully automated surface sampling system.
    Type: Application
    Filed: June 3, 2005
    Publication date: December 7, 2006
    Inventors: Gary Van Berkel, Vilmos Kertesz, Michael Ford