Patents by Inventor Vinay B. Jayaram

Vinay B. Jayaram has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Built in self test for input/output characterization
    Patent number: 7814386
    Abstract: A test system in an integrated circuit includes at least one boundary scan cell. The boundary scan cell includes a first storage element and a second storage element connected in series with the first storage element. The boundary scan cell also includes test logic configured to provide a test completion signal indicative of completion of a respective test based on a comparison of an output of the first storage element relative to test value (TVALUE). The output of the first storage element is provided to the input of the second storage element unchanged during a first operating state and, depending on the test completion signal, an inverted version of the output of the first storage element can be provided to the input of the second storage element during a second operating state. A bi-directional element is connected to receive the output of the second storage element and to feed the output of the second storage element back to an input of the first storage element.
    Type: Grant
    Filed: May 8, 2008
    Date of Patent: October 12, 2010
    Assignee: Texas Instruments Incorporated
    Inventors: John Joseph Seibold, Vinay B. Jayaram, Elie Torbey
  • BUILT IN SELF TEST FOR INPUT/OUTPUT CHARACTERIZATION
    Publication number: 20090113264
    Abstract: A test system in an integrated circuit includes at least one boundary scan cell. The boundary scan cell includes a first storage element and a second storage element connected in series with the first storage element. The boundary scan cell also includes test logic configured to provide a test completion signal indicative of completion of a respective test based on a comparison of an output of the first storage element relative to test value (TVALUE). The output of the first storage element is provided to the input of the second storage element unchanged during a first operating state and, depending on the test completion signal, an inverted version of the output of the first storage element can be provided to the input of the second storage element during a second operating state. A bi-directional element is connected to receive the output of the second storage element and to feed the output of the second storage element back to an input of the first storage element.
    Type: Application
    Filed: May 8, 2008
    Publication date: April 30, 2009
    Inventors: JOHN Joseph SEIBOLD, Vinay B. Jayaram, Elie Torbey