Patents by Inventor Vinay Kumar M N

Vinay Kumar M N has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240329850
    Abstract: The present disclosure provides a method and a flash memory device for detecting temperature in the flash memory device. The method includes receiving an Input/Output (I/O) request from a host device and determining on-cell count value for a targeted page within an active block of the flash memory device upon receiving the I/O request. The method further includes comparing the on-cell count value of the targeted page, which is within the active block of the flash memory device, with a stored on-cell count data of the flash memory device. Additionally, the method includes determining the temperature of the flash memory device corresponding to a stored on-cell count value based on the comparison. A notification signal is transmitted to the host device based on the temperature of the flash memory device and a threshold operating temperature of the flash memory device.
    Type: Application
    Filed: January 10, 2024
    Publication date: October 3, 2024
    Inventors: Vinay Kumar M N, Akhilesh Kumar Jaiswal, Puneet Kukreja
  • Patent number: 12067233
    Abstract: The present disclosure relates to a method and system for tuning a memory device for high-speed transitions. Upon failure of bus sampling tuning of a memory device with default tuning parameters, the host device is configured to transmit an auto-tuning request to the memory device for until one or more pre-defined conditions are satisfied. The memory device is configured to receive the auto-tuning request from the host device, selects a set of tuning parameters from a plurality of sets of tuning parameters, and transmits a tuning block to the host device based on the selected set of tuning parameters, until one or more pre-defined conditions are satisfied. Thereby, the memory device can utilize high-speed mode and high-speed transitions can be achieved between host and memory devices. Thus, initialization failure of the memory device can also be avoided.
    Type: Grant
    Filed: September 21, 2022
    Date of Patent: August 20, 2024
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Shankar Athanikar, Akhilesh Kumar Jaiswal, Puneet Kukreja, Sumeet Paul, Vinay Kumar M N
  • Publication number: 20240020000
    Abstract: The present disclosure relates to a method and system for tuning a memory device for high-speed transitions. Upon failure of bus sampling tuning of a memory device with default tuning parameters, the host device is configured to transmit an auto-tuning request to the memory device for until one or more pre-defined conditions are satisfied. The memory device is configured to receive the auto-tuning request from the host device, selects a set of tuning parameters from a plurality of sets of tuning parameters, and transmits a tuning block to the host device based on the selected set of tuning parameters, until one or more pre-defined conditions are satisfied. Thereby, the memory device can utilize high-speed mode and high-speed transitions can be achieved between host and memory devices. Thus, initialization failure of the memory device can also be avoided.
    Type: Application
    Filed: September 21, 2022
    Publication date: January 18, 2024
    Inventors: Shankar Athanikar, Akhilesh Kumar Jaiswal, Puneet Kukreja, Sumeet Paul, Vinay Kumar M N