Patents by Inventor Vinay Kumar Velkuru

Vinay Kumar Velkuru has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Cold source based noise figure measurement using S-parameters and a vector signal transceiver/vector signal analyzer/spectrum analyzer
    Patent number: 10371733
    Abstract: The noise figure for a radio frequency device may be obtained through power measurements. A signal flow graph based upon the S-parameter information of the entire RF system may be constructed. The S-parameter information may be representative of the microwave termination, the device, the measurement instrument and any losses due to additional components such as connecting cables/attenuators/switches, etc. The signal flow graph includes proper placement and values of the source nodes corresponding to each RF sub-system enumerated above. Noise figure measurements may include a calibration step and a measurement step. During the calibration step the noise figure and the noise temperature of the measurement instrument used for the measurement may be obtained. During the measurement step, the noise figure and the noise temperature of the device may be obtained based at least on the noise figure and noise temperature of the measurement instrument obtained during the calibration step.
    Type: Grant
    Filed: January 4, 2017
    Date of Patent: August 6, 2019
    Assignee: National Instruments Corporation
    Inventors: Prabhat Pal, Vinay Kumar Velkuru, Brian J. Avenell
  • Cold Source Based Noise Figure Measurement Using S-Parameters and a Vector Signal Transceiver/Vector Signal Analyzer/Spectrum Analyzer
    Publication number: 20180188306
    Abstract: The noise figure for a radio frequency device may be obtained through power measurements. A signal flow graph based upon the S-parameter information of the entire RF system may be constructed. The S-parameter information may be representative of the microwave termination, the device, the measurement instrument and any losses due to additional components such as connecting cables/attenuators/switches, etc. The signal flow graph includes proper placement and values of the source nodes corresponding to each RF sub-system enumerated above. Noise figure measurements may include a calibration step and a measurement step. During the calibration step the noise figure and the noise temperature of the measurement instrument used for the measurement may be obtained. During the measurement step, the noise figure and the noise temperature of the device may be obtained based at least on the noise figure and noise temperature of the measurement instrument obtained during the calibration step.
    Type: Application
    Filed: January 4, 2017
    Publication date: July 5, 2018
    Inventors: Prabhat Pal, Vinay Kumar Velkuru, Brian J. Avenell