Patents by Inventor Vinaya Kavathekar

Vinaya Kavathekar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10444749
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: October 15, 2019
    Assignee: BROOKS AUTOMATION, INC.
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Patent number: 8972029
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: March 3, 2015
    Assignee: Brooks Automation, Inc.
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Patent number: 8775148
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: July 8, 2014
    Assignee: Brooks Automation, Inc.
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Patent number: 8639365
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: January 28, 2014
    Assignee: Brooks Automation, Inc.
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Patent number: 8639489
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: January 28, 2014
    Assignee: Brooks Automation, Inc.
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Patent number: 8612198
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: December 17, 2013
    Assignee: Brooks Automation, Inc.
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Patent number: 8473270
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: June 25, 2013
    Assignee: Brooks Automation, Inc.
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Patent number: 7945348
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: May 17, 2011
    Assignee: Brooks Automation, Inc.
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Patent number: 7899562
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: March 1, 2011
    Assignee: Brooks Automation, Inc.
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Patent number: 7769482
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: August 3, 2010
    Assignee: Brooks Automation, Inc.
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Publication number: 20080167890
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Application
    Filed: October 23, 2007
    Publication date: July 10, 2008
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Publication number: 20080163096
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Application
    Filed: October 23, 2007
    Publication date: July 3, 2008
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Publication number: 20080163094
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Application
    Filed: October 23, 2007
    Publication date: July 3, 2008
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Publication number: 20080163095
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Application
    Filed: October 23, 2007
    Publication date: July 3, 2008
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Publication number: 20080155447
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Application
    Filed: October 23, 2007
    Publication date: June 26, 2008
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Publication number: 20080155443
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Application
    Filed: October 23, 2007
    Publication date: June 26, 2008
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Publication number: 20080155449
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Application
    Filed: October 23, 2007
    Publication date: June 26, 2008
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Publication number: 20080155446
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Application
    Filed: October 23, 2007
    Publication date: June 26, 2008
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Publication number: 20080155448
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Application
    Filed: October 23, 2007
    Publication date: June 26, 2008
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Publication number: 20080155445
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Application
    Filed: October 23, 2007
    Publication date: June 26, 2008
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen