Patents by Inventor Vinaya Kavathekar
Vinaya Kavathekar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10444749Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.Type: GrantFiled: October 23, 2007Date of Patent: October 15, 2019Assignee: BROOKS AUTOMATION, INC.Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
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Patent number: 8972029Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.Type: GrantFiled: October 23, 2007Date of Patent: March 3, 2015Assignee: Brooks Automation, Inc.Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
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Patent number: 8775148Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.Type: GrantFiled: October 23, 2007Date of Patent: July 8, 2014Assignee: Brooks Automation, Inc.Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
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Patent number: 8639365Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.Type: GrantFiled: October 23, 2007Date of Patent: January 28, 2014Assignee: Brooks Automation, Inc.Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
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Patent number: 8639489Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.Type: GrantFiled: October 23, 2007Date of Patent: January 28, 2014Assignee: Brooks Automation, Inc.Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
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Patent number: 8612198Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.Type: GrantFiled: October 23, 2007Date of Patent: December 17, 2013Assignee: Brooks Automation, Inc.Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
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Patent number: 8473270Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.Type: GrantFiled: October 23, 2007Date of Patent: June 25, 2013Assignee: Brooks Automation, Inc.Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
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Patent number: 7945348Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.Type: GrantFiled: October 23, 2007Date of Patent: May 17, 2011Assignee: Brooks Automation, Inc.Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
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Patent number: 7899562Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.Type: GrantFiled: October 23, 2007Date of Patent: March 1, 2011Assignee: Brooks Automation, Inc.Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
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Patent number: 7769482Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.Type: GrantFiled: October 23, 2007Date of Patent: August 3, 2010Assignee: Brooks Automation, Inc.Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
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Publication number: 20080167890Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.Type: ApplicationFiled: October 23, 2007Publication date: July 10, 2008Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
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Publication number: 20080163096Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.Type: ApplicationFiled: October 23, 2007Publication date: July 3, 2008Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
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Publication number: 20080163094Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.Type: ApplicationFiled: October 23, 2007Publication date: July 3, 2008Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
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Publication number: 20080163095Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.Type: ApplicationFiled: October 23, 2007Publication date: July 3, 2008Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
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Publication number: 20080155447Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.Type: ApplicationFiled: October 23, 2007Publication date: June 26, 2008Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
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Publication number: 20080155443Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.Type: ApplicationFiled: October 23, 2007Publication date: June 26, 2008Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
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Publication number: 20080155449Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.Type: ApplicationFiled: October 23, 2007Publication date: June 26, 2008Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
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Publication number: 20080155446Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.Type: ApplicationFiled: October 23, 2007Publication date: June 26, 2008Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
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Publication number: 20080155448Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.Type: ApplicationFiled: October 23, 2007Publication date: June 26, 2008Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
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Publication number: 20080155445Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.Type: ApplicationFiled: October 23, 2007Publication date: June 26, 2008Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen