Patents by Inventor Vincent Patrick Wallace

Vincent Patrick Wallace has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220276161
    Abstract: The present disclosure provides a method of analyzing an area of interest of a sample material which comprises directing a first radiation to a first area of interest, the first radiation having frequencies within a terahertz frequency range. The method also comprises receiving a first signal THz1 being a quantity related to radiation received from the first area of interest in response to directing the first radiation to the first area of interest, the first signal THz1 being dependent on a first property and on a second property of the first area of interest. Further, the method comprises directing a second radiation to the first area of interest, the second radiation having frequencies within a frequency range that is different to that of the first radiation.
    Type: Application
    Filed: August 28, 2020
    Publication date: September 1, 2022
    Inventors: Vincent Patrick Wallace, Anthony James Fitzgerald, Adam Philip Gibson
  • Patent number: 9006660
    Abstract: A THz radiation probe (1) for examining an object (8), the probe comprising a first portion configured to be inserted into an opening of said object in a first direction (5), said probe further comprising at least one THz emitter (15), directing means (7) for directing THz radiation emitted from said emitter to said object via an aperture (2) located at said first portion and subsequently from said object to at least one THz detector (17) and, means for scanning said emitted THz radiation across said object in a scan direction, said scan direction having a component in said first direction (5).
    Type: Grant
    Filed: August 28, 2008
    Date of Patent: April 14, 2015
    Assignee: TeraView Limited
    Inventors: Bryan Edward Cole, Vincent Patrick Wallace, Michael John Withers, John Baker, Brian Robertson
  • Publication number: 20110028824
    Abstract: A THz radiation probe (1) for examining an object (8), the probe comprising a first portion configured to be inserted into an opening of said object in a first direction (5), said probe further comprising at least one THz emitter (15), directing means (7) for directing THz radiation emitted from said emitter to said object via an aperture (2) located at said first portion and subsequently from said object to at least one THz detector (17) and, means for scanning said emitted THz radiation across said object in a scan direction, said scan direction having a component in said first direction (5).
    Type: Application
    Filed: August 28, 2008
    Publication date: February 3, 2011
    Inventors: Bryan Edward Cole, Vincent Patrick Wallace, Michael John Withers, John Baker, Brian Robertson
  • Patent number: 7335883
    Abstract: A method of imaging a sample, the method comprising: (a) irradiating a sample with a pulse of electromagnetic radiation, said pulse having a plurality of frequencies in the range from 25 GHz to 100 THz; (b) determining a first parameter related to the amplitude of the radiation, which is either reflected from and/or transmitted by the sample, in the time domain; (c) calculating the value of the first parameter at a first time value relative to the value of the first parameter at a second time value which coincides with a physical feature of the dataset of the first parameter with respect to time; and (d) generating an image by plotting the value calculated in step (c) for different points of the sample.
    Type: Grant
    Filed: July 29, 2002
    Date of Patent: February 26, 2008
    Assignee: Teraview Limited
    Inventors: Vincent Patrick Wallace, Ruth Mary Woodward, Donald Dominic Arnone, Bryan Edward Cole