Abstract: Embodiments of an IC design system for test row/structure layout design are described in this application. The design system may include a test chip complier database, a test chip complier engine (TCCE), and a user interface module. The TCCE may be configured to communicate with at least the test chip compiler database and the user interface module, and configured to allow a user to automatically generate a test chip layout by providing an integrated circuit design system. With the system, a user can automatically generate a design by specifying the test row or test structure layout requirements for the design using sets of predefined templates, changing design template parameters using a table driven input format, scheduling generation of the design on a preferred layout design tool, visually inspecting the generated design for errors, and/or applying version controls to the generated design. Other embodiments are described.