Abstract: A memory apparatus and method of operation are provided. The apparatus includes memory cells each connected to word lines and disposed in memory holes. The memory holes are arranged in rows comprising strings which are grouped into blocks comprising a first plane and a second plane. A control means is configured to program memory cells of the first plane and the second plane connected to one of the word lines using iterations of a program operation. The control means terminates programming of the first plane prior to completing programming of the first plane in response to determining the first plane programs slower than the second plane by a predetermined number of the iterations of the program operation. The control means adjusts the predetermined number of the iterations based on an additional verify iteration performed on at least some of the memory cells beyond the iterations of the program operation.

Abstract: In addition to word line related short circuits within the blocks of the array structure of a non-volatile memory device, such as NAND memory, word line related shorts can also occur in the routing for supplying the word lines of the memory blocks. Depending on the layout of the routing, some shorts for the word lines associated with one block can affect other blocks of the memory array. In particular, if the routing of a pair of adjacent local supply lines are adjacent to a global supply line, a short between the pair of adjacent local supply lines for one block can lead, through the global supply line, to defects in another of the block. Techniques are presented for detecting these layout related problematic word lines.

Abstract: In some situations, a leak on a wordline may be a localized problem that causes data loss in a block that contains the wordline. In other situations, such as when the leak occurs near a peripheral wordline routing area, the leak can affect the entire memory die. The storage system provided herein has a fatal wordline leak detector that determines the type of leak and, accordingly, whether just the block should be retired or whether related blocks should be retired.

Abstract: In addition to word line related short circuits within the blocks of the array structure of a non-volatile memory device, such as NAND memory, word line related shorts can also occur in the routing for supplying the word lines of the memory blocks. Depending on the layout of the routing, some shorts for the word lines associated with one block can affect other blocks of the memory array. In particular, if the routing of a pair of adjacent local supply lines are adjacent to a global supply line, a short between the pair of adjacent local supply lines for one block can lead, through the global supply line, to defects in another of the block. Techniques are presented for detecting these layout related problematic word lines.

Abstract: A memory apparatus and method of operation are provided. The apparatus includes memory cells each connected to word lines and disposed in memory holes. The memory holes are arranged in rows comprising strings which are grouped into blocks comprising a first plane and a second plane. A control means is configured to program memory cells of the first plane and the second plane connected to one of the word lines using iterations of a program operation. The control means terminates programming of the first plane prior to completing programming of the first plane in response to determining the first plane programs slower than the second plane by a predetermined number of the iterations of the program operation. The control means adjusts the predetermined number of the iterations based on an additional verify iteration performed on at least some of the memory cells beyond the iterations of the program operation.

Abstract: A flash memory includes an improved error handling algorithm for data recovery. Rather than running a default read recovery only, an Enhance Read Retry (ERR) process also is performed. After running a default read recovery, WLs are flagged with an error flag if the read was unsuccessful. The flag triggers ERR mode. ERR mode implements increase of the row read bias or implements increase of row read time or implements multiple pulses at the same voltage, or a combination of all three.

Abstract: The memory device includes a memory block with an array of memory cells. The memory device also includes control circuitry that is in communication with the memory cells. The control circuitry is configured to program a group of the memory cells in a programming operation that does not include verify to obtain a natural threshold voltage (nVt) distribution, calculate an nVt width of the nVt distribution, compare the nVt width to a threshold, and identify the memory block as being vulnerable to cross-temperature read errors in response to the nVt width exceeding the threshold.

Abstract: In some situations, a leak on a wordline may be a localized problem that causes data loss in a block that contains the wordline. In other situations, such as when the leak occurs near a peripheral wordline routing area, the leak can affect the entire memory die. The storage system provided herein has a fatal wordline leak detector that determines the type of leak and, accordingly, whether just the block should be retired or whether related blocks should be retired.

Abstract: The memory device includes a memory block with an array of memory cells. The memory device also includes control circuitry that is in communication with the memory cells. The control circuitry is configured to program a group of the memory cells in a programming operation that does not include verify to obtain a natural threshold voltage (nVt) distribution, calculate an nVt width of the nVt distribution, compare the nVt width to a threshold, and identify the memory block as being vulnerable to cross-temperature read errors in response to the nVt width exceeding the threshold.

Abstract: Apparatuses and techniques are described for recovering from errors in a read operation. When a read operation results in an uncorrectable read error, recovery read operations are performed for each read voltage of a page of data. Each recovery read operation uses a different timing. The different timings can involve a time period which is allocated for a voltage transition, such as a settling time of a word line or bit line voltage, or a time allocated for an under kick or over kick of a word line or bit line voltage. An error count is obtained for each different timing, and an optimum timing is determined based on the lowest error count. A retry read operation is performed in which an optimum timing is used for the voltage transition for each read voltage of the page.

Abstract: An apparatus to apply a foam seal to a part is provided. The apparatus comprises a receiving device to secure the part, a loading device and a driving device to drive the loading device. The receiving device includes a housing, a first rod coupled to the housing and at least partially disposed in the housing and a resilient member connected between the housing and the first rod at a radial direction. The loading device includes an actuating member and a holding member to hold the foam seal. The driving device is configured to move the loading device between a loading position and an application position and further drive the actuating member and the holding member to rotate around an axis parallel to the first rod. The actuation member contacts the housing while rotating and the foam seal on the holding member contacts the part at the application position.

Abstract: Embodiments of the present disclosure relate to a method and apparatus for managing a failure of a device. The method comprises detecting whether a failure occurs in a device, and generating a failure report for the failure in response to the failure occurring in the device. The method further comprises querying a device object repository with the failure report, and the object device repository stores historical failure information associated with the device and a fix solution corresponding to the historical failure information. The method further comprises obtaining the fix solution from the device object repository based on a comparison between the failure report and the historical failure information. Embodiments of the present disclosure can manage the failure of the device more effectively.

Abstract: An air outlet assembly comprises an air housing for air flowing through; a retainer connected to the air housing; a plurality of vanes disposed on the retainer, spaced apart each other and rotatably connected to the retainer; and a sliding link. The sliding link is disposed on an inner surface of the air housing, adjacent to the retainer, coupled with each of the vanes and configured to be slidable on the inner surface so as to orient each of the vanes relative to the air housing.

Abstract: An air outlet assembly comprises an air housing for air flowing through; a retainer connected to the air housing; a plurality of vanes disposed on the retainer, spaced apart each other and rotatably connected to the retainer; and a sliding link. The sliding link is disposed on an inner surface of the air housing, adjacent to the retainer, coupled with each of the vanes and configured to be slidable on the inner surface so as to orient each of the vanes relative to the air housing.

Abstract: An apparatus to apply a foam seal to a part is provided. The apparatus comprises a receiving device to secure the part, a loading device and a driving device to drive the loading device. The receiving device includes a housing, a first rod coupled to the housing and at least partially disposed in the housing and a resilient member connected between the housing and the first rod at a radial direction. The loading device includes an actuating member and a holding member to hold the foam seal. The driving device is configured to move the loading device between a loading position and an application position and further drive the actuating member and the holding member to rotate around an axis parallel to the first rod. The actuation member contacts the housing while rotating and the foam seal on the holding member contacts the part at the application position.

Abstract: Embodiments of the present disclosure relate to a method and apparatus for managing a failure of a device. The method comprises detecting whether a failure occurs in a device, and generating a failure report for the failure in response to the failure occurring in the device. The method further comprises querying a device object repository with the failure report, and the object device repository stores historical failure information associated with the device and a fix solution corresponding to the historical failure information. The method further comprises obtaining the fix solution from the device object repository based on a comparison between the failure report and the historical failure information. Embodiments of the present disclosure can manage the failure of the device more effectively.