Patents by Inventor Vineethanand Hariharan

Vineethanand Hariharan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Characterization System and Method With Guided Defect Discovery
    Publication number: 20220172497
    Abstract: A system is disclosed, in accordance with one or more embodiment of the present disclosure. The system may include a controller including one or more processors configured to execute a set of program instructions. The set of program instructions may be configured to cause the processors to: receive images of a sample from a characterization sub-system; identify target clips from patch clips; prepare processed clips based on the target clips; generate encoded images by transforming the processed clips; sort the encoded images into a set of clusters; display sorted images from the set of clusters; receive labels for the displayed sorted images; determine whether the received labels are sufficient to train a deep learning classifier; and upon determining the received labels are sufficient to train the deep learning classifier, train the deep learning classifier via the displayed sorted images and the received labels.
    Type: Application
    Filed: February 18, 2022
    Publication date: June 2, 2022
    Inventors: Bradley Ries, Tommaso Torelli, Muthukrishnan Sankar, Vineethanand Hariharan
  • Characterization system and method with guided defect discovery
    Patent number: 11256967
    Abstract: A system is disclosed, in accordance with one or more embodiment of the present disclosure. The system may include a controller including one or more processors configured to execute a set of program instructions. The set of program instructions may be configured to cause the processors to: receive images of a sample from a characterization sub-system; identify target clips from patch clips; prepare processed clips based on the target clips; generate encoded images by transforming the processed clips; sort the encoded images into a set of clusters; display sorted images from the set of clusters; receive labels for the displayed sorted images; determine whether the received labels are sufficient to train a deep learning classifier; and upon determining the received labels are sufficient to train the deep learning classifier, train the deep learning classifier via the displayed sorted images and the received labels.
    Type: Grant
    Filed: April 13, 2020
    Date of Patent: February 22, 2022
    Assignee: KLA Corporation
    Inventors: Bradley Ries, Tommaso Torelli, Muthukrishnan Sankar, Vineethanand Hariharan
  • Characterization System and Method With Guided Defect Discovery
    Publication number: 20210232872
    Abstract: A system is disclosed, in accordance with one or more embodiment of the present disclosure. The system may include a controller including one or more processors configured to execute a set of program instructions. The set of program instructions may be configured to cause the processors to: receive images of a sample from a characterization sub-system; identify target clips from patch clips; prepare processed clips based on the target clips; generate encoded images by transforming the processed clips; sort the encoded images into a set of clusters; display sorted images from the set of clusters; receive labels for the displayed sorted images; determine whether the received labels are sufficient to train a deep learning classifier; and upon determining the received labels are sufficient to train the deep learning classifier, train the deep learning classifier via the displayed sorted images and the received labels.
    Type: Application
    Filed: April 13, 2020
    Publication date: July 29, 2021
    Inventors: Bradley Ries, Tommaso Torelli, Muthukrishnan Sankar, Vineethanand Hariharan