Abstract: A memory device includes a memory array having a plurality of memory cells each having first and second power supply nodes, first and second virtual power supply nodes, a latch circuit, and a write assist circuit. The latch circuit includes a first and second inverters in a cross-coupled inverter configuration. The first inverter is connected between the first virtual power supply node and the second power supply node, and the second inverter is connected between the second virtual power supply node and the second power supply node.

Abstract: An electronic storage device includes a bit cell circuit, feedback circuit, and read accelerator circuit. The bit cell circuit is adapted for connection with true and complementary bit lines. The feedback circuit includes a first transistor which is coupled to a first voltage potential and responsive to the complementary bit line. The read accelerator circuit includes second, third, and fourth transistors coupled between the feedback circuit and a second voltage potential. The second transistor is responsive to a read line, the third transistor is responsive to the true bit line, and the fourth transistor is responsive to the complementary bit line. The read accelerator circuit is configured to provide a discharge path for at least one of the true bit line and the complementary bit line during a read access of the bit cell. Embodiments of a corresponding electronic read access accelerator device and method are also provided.

Abstract: A read circuit includes a precharge circuit, coupled with at least a subset of bit lines and a sense circuit in a memory, and a transmission gate. The precharge circuit receives a first control signal and is operative during a first mode to set the bit lines to a first voltage level and to set an input to the sense circuit to a second voltage level. The transmission gate connects a given one of the bit lines with the sense circuit during a second mode as a function of a second control signal, such that when reading a first logic level from the selected memory cell, when the input of the sense circuit is connected with the given bit line, the given bit line is discharged to at least a third voltage, which is between the first and second voltage levels, thereby reducing a read access time in the memory.

Abstract: A read circuit includes a precharge circuit, coupled with at least a subset of bit lines and a sense circuit in a memory, and a transmission gate. The precharge circuit receives a first control signal and is operative during a first mode to set the bit lines to a first voltage level and to set an input to the sense circuit to a second voltage level. The transmission gate connects a given one of the bit lines with the sense circuit during a second mode as a function of a second control signal, such that when reading a first logic level from the selected memory cell, when the input of the sense circuit is connected with the given bit line, the given bit line is discharged to at least a third voltage, which is between the first and second voltage levels, thereby reducing a read access time in the memory.

Abstract: A memory device includes a memory array comprising a plurality of memory cells. At least a given one of the memory cells comprises a pair of cross-coupled inverters and associated write assist circuitry. The write assist circuitry comprises first switching circuitry coupled between a supply node of a device of the first inverter and a supply node of the memory cell, and second switching circuitry coupled between a supply node of a device of the second inverter and the supply node of the memory cell. The first and second switching circuitry are separately controlled, with the first switching circuitry being controlled using a wordline and an uncomplemented bitline of the memory device, and the second switching circuitry being controlled using the wordline and a complemented bitline of the memory device.

Abstract: An electronic storage device includes a bit cell circuit, feedback circuit, and read accelerator circuit. The bit cell circuit is adapted for connection with true and complementary bit lines. The feedback circuit includes a first transistor which is coupled to a first voltage potential and responsive to the complementary bit line. The read accelerator circuit includes second, third, and fourth transistors coupled between the feedback circuit and a second voltage potential. The second transistor is responsive to a read line, the third transistor is responsive to the true bit line, and the fourth transistor is responsive to the complementary bit line. The read accelerator circuit is configured to provide a discharge path for at least one of the true bit line and the complementary bit line during a read access of the bit cell. Embodiments of a corresponding electronic read access accelerator device and method are also provided.

Abstract: An integrated circuit having a CAM array includes a plurality of CAM cells organized in rows and columns where each row corresponds to an address word and each column corresponds to a bit position, and a match line for each row connected to be shared by CAM cells in that row. The CAM array also includes a feedback circuit for each row connected to limit a discharge voltage for a corresponding match line in that row. In another aspect, a method of operating an integrated circuit having a CAM array includes organizing a plurality of CAM cells in rows and columns where each row corresponds to an address word and each column corresponds to a bit position, and sharing a match line with CAM cells in each row. The method also includes limiting a discharge voltage for the match line.

Abstract: A CAM circuit includes a plurality of core memory cells, each cell including comparison logic for generating a local match signal based on a comparison between stored data in the cell and a compare value. The CAM circuit includes a plurality of local match lines, each local match line coupled with a corresponding cell and adapted to convey the local match signal generated by the cell. The CAM circuit includes combination logic for receiving respective local match signals generated by a subset of the cells and for generating an output word match signal having a value indicative of the local match signals. The subset of cells is arranged with at least one block having a word size that is limited based on available space for routing tracks used to convey the local match signals and at least one word match signal in a base metal layer across the cells.

Abstract: A memory device includes a memory array comprising a plurality of memory cells. At least a given one of the memory cells comprises a pair of cross-coupled inverters and associated write assist circuitry. The write assist circuitry comprises first switching circuitry coupled between a supply node of a device of the first inverter and a supply node of the memory cell, and second switching circuitry coupled between a supply node of a device of the second inverter and the supply node of the memory cell. The first and second switching circuitry are separately controlled such that during a write operation of the memory cell the supply node of one of the devices is connected to the supply node of the memory cell while the supply node of the other device is not connected to the supply node of the memory cell but is instead permitted to float.

Abstract: A memory device includes a memory array comprising a plurality of memory cells. At least a given one of the memory cells comprises a pair of cross-coupled inverters and associated write assist circuitry. The write assist circuitry comprises first switching circuitry coupled between a supply node of a device of the first inverter and a supply node of the memory cell, and second switching circuitry coupled between a supply node of a device of the second inverter and the supply node of the memory cell. The first and second switching circuitry are separately controlled, with the first switching circuitry being controlled using a wordline and an uncomplemented bitline of the memory device, and the second switching circuitry being controlled using the wordline and a complemented bitline of the memory device.

Abstract: An integrated circuit having a CAM array includes a plurality of CAM cells organized in rows and columns where each row corresponds to an address word and each column corresponds to a bit position, and a match line for each row connected to be shared by CAM cells in that row. The CAM array also includes a feedback circuit for each row connected to limit a discharge voltage for a corresponding match line in that row. In another aspect, a method of operating an integrated circuit having a CAM array includes organizing a plurality of CAM cells in rows and columns where each row corresponds to an address word and each column corresponds to a bit position, and sharing a match line with CAM cells in each row. The method also includes limiting a discharge voltage for the match line.

Abstract: A memory device includes a memory array comprising a plurality of memory cells. At least a given one of the memory cells comprises a pair of cross-coupled inverters and associated write assist circuitry. The write assist circuitry comprises first switching circuitry coupled between a supply node of a device of the first inverter and a supply node of the memory cell, and second switching circuitry coupled between a supply node of a device of the second inverter and the supply node of the memory cell. The first and second switching circuitry are separately controlled such that during a write operation of the memory cell the supply node of one of the devices is connected to the supply node of the memory cell while the supply node of the other device is not connected to the supply node of the memory cell but is instead permitted to float.