Patents by Inventor Vipin Kewal Ramani

Vipin Kewal Ramani has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7085686
    Abstract: A method and system for canceling noise and compressing data from a motor phase angle sensor. In this invention, phase angle data is sampled at a first sampling rate to generate a sampled phase angle. The sampled phase angle signal is sub-sampled at a second sampling rate to generate a sub-sampled phase angle signal which is transformed by subtracting each of the sub-sampled data points of the sub-sampled signal from 90 degrees to generate a transformed signal. The transformed phase angle signal is then convoluted with a wavelet signal to generate a convoluted phase angle signal. Next, a phase angle range signal is generated by calculating the range between the largest and smallest convoluted data points within each of a plurality of segments of the convoluted signal. A moving average calculation is performed on the phase angle range signal to generate a moving average signal.
    Type: Grant
    Filed: March 5, 1999
    Date of Patent: August 1, 2006
    Assignee: General Electric Company
    Inventors: Yu-To Chen, Sharon Shihua Liu, Vipin Kewal Ramani, Nicolas Wadih Chbat
  • Patent number: 6643799
    Abstract: A system and method for diagnosing and validating a machine with waveform data generated therefrom. Historical waveform data are obtained from machines having known faults along with corresponding actions for repairing the machines and are used to develop fault classification rules. The fault classification rules are stored in a diagnostic knowledge database. The database of classification rules are used to diagnose new waveform data from a machine having an unknown fault.
    Type: Grant
    Filed: May 3, 2000
    Date of Patent: November 4, 2003
    Assignee: General Electric Company
    Inventors: Piero Patrone Bonissone, Yu-To Chen, Vipin Kewal Ramani, Rasiklal Punjalal Shah, John Andrew Johnson, Phillip Edward Steen, Ramesh Ramachandran
  • Patent number: 6609217
    Abstract: A system and method for diagnosing and validating a machine over a network using waveform data. Historical waveform data are obtained via the network from machines having known faults along with corresponding actions for repairing the machines and are used to develop fault classification rules. The fault classification rules are stored in a diagnostic knowledge database. The database of classification rules are used to diagnose new waveform data from a machine having an unknown fault, via the network.
    Type: Grant
    Filed: May 26, 2000
    Date of Patent: August 19, 2003
    Assignee: General Electric Company
    Inventors: Piero Patrone Bonissone, Yu-To Chen, Vipin Kewal Ramani, Rasiklal Punjalal Shah, John Andrew Johnson, Phillip Edward Steen, Ramesh Ramchandran
  • Patent number: 6507831
    Abstract: The present invention is directed to a method for processing records to extract relevant, reusable diagnostic information and make the information available in a form capable of being used by field engineers to speed the diagnosis and repair or adjustment of equipment.
    Type: Grant
    Filed: November 16, 1999
    Date of Patent: January 14, 2003
    Assignee: General Electric Company
    Inventors: Anil Varma, Rasiklal Punjalal Shah, Vipin Kewal Ramani, Randal V. Dusing
  • Patent number: 6473659
    Abstract: This invention provides a system and method for integrating a plurality of diagnostic information from a multiple of sources. In this invention, there is a site specific database which contains site specific information for a machine. A plurality of diagnostic related information is obtained from the machine. A diagnostic router collects the site specific information for the machine and the plurality of diagnostic related information and generates a current incident record therefrom. An approved incident record database contains a plurality of approved incident records obtained from a plurality of machines. An integrator finds approved incident records from the approved incident record database that most closely match the current incident record.
    Type: Grant
    Filed: April 10, 1998
    Date of Patent: October 29, 2002
    Assignee: General Electric Company
    Inventors: Rasiklal Punjalal Shah, Vipin Kewal Ramani, Susan Teeter Wallenslager, Christopher James Dailey
  • Patent number: 6442542
    Abstract: A diagnostic system is provided for identifying faults in a machine (e.g., CT scanner, MRI system, x-ray apparatus) by analyzing a data file generated thereby. The diagnostic system includes a trained database containing a plurality of trained data, each trained data associated with one of plurality of known fault types. Each trained data is represented by a trained set of feature values and corresponding weight values. Once a data file is generated by the machine, a current set of feature values are extracted from the data file by performing various analyses (e.g., time domain analysis, frequency domain analysis, wavelet analysis). The current set of feature values extracted is analyzed by a fault detector which produces a candidate set of faults based on the trained set of feature values and corresponding weight values for each of the fault types. The candidate set of faults produced by the fault detector is presented to a user along with a recommend repair procedure.
    Type: Grant
    Filed: October 8, 1999
    Date of Patent: August 27, 2002
    Assignee: General Electric Company
    Inventors: Vipin Kewal Ramani, Rasiklal Punjalal Shah, Ramesh Ramachandran, Piero Patrone Bonissone, Yu-To Chen, Phillip Edward Steen, John Andrew Johnson
  • Patent number: 6275559
    Abstract: A system is provided for identifying faults in a non-OEM computed tomography system having components in connection with the detectors to reconstruct an image. Then, correlation values are derived from baseline reference data files and current data files collected after a fault is suspected in the CT system. The correlation values are compared against a threshold to identify suspect detectors and a pattern recognition algorithm is applied to determine if the suspect detectors are faulty or if one of the components processing the output signals has failed. If baseline files are unavailable, the identification of faulty components is accomplished by performing correlation between the current data files and average profile values.
    Type: Grant
    Filed: October 8, 1999
    Date of Patent: August 14, 2001
    Assignee: General Electric Company
    Inventors: Vipin Kewal Ramani, Rasiklal Punjalal Shah, Peter Michael Edic, Shankar Visvanathan Guru, Abdalmajeid Musa Alyassin, Randal Vincent Dusing
  • Patent number: 6105149
    Abstract: The present invention discloses a system and method for diagnosing and validating a machine with waveform data generated therefrom. In this invention, historical waveform data are obtained from machines having known faults along with corresponding actions for repairing the machines and are used to develop fault classification rules. The fault classification rules are stored in a diagnostic knowledge database. The database of classification rules are used to diagnose new waveform data from a machine having an unknown fault.
    Type: Grant
    Filed: March 30, 1998
    Date of Patent: August 15, 2000
    Assignee: General Electric Company
    Inventors: Piero Patrone Bonissone, Yu-To Chen, Vipin Kewal Ramani, Rasiklal Punjalal Shah, John Andrew Johnson, Phillip Edward Steen, Ramesh Ramachandran