Patents by Inventor Vipul K. GUPTA

Vipul K. GUPTA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and methods for determining a quality score for a part manufactured by an additive manufacturing machine
    Patent number: 11580430
    Abstract: Determining a quality score for a part manufactured by an additive manufacturing machine based on build parameters and sensor data without the need for extensive physical testing of the part. Sensor data is received from the additive manufacturing machine during manufacture of the part using a first set of build parameters. The first set of build parameters is received. A first algorithm is applied to the first set of build parameters and the received sensor data to generate a quality score. The first algorithm is trained by receiving a reference derived from physical measurements performed on at least one reference part built using a reference set of build parameters. The quality score is output via the communication interface of the device.
    Type: Grant
    Filed: January 25, 2019
    Date of Patent: February 14, 2023
    Assignee: General Electric Company
    Inventors: Lembit Salasoo, Vipul K. Gupta, Xiaohu Ping, Subhrajit Roychowdhury, Justin Gambone, Jr., Naresh Iyer, Xiaolei Shi, Mengli Wang
  • SYSTEM AND METHODS FOR DETERMINING A QUALITY SCORE FOR A PART MANUFACTURED BY AN ADDITIVE MANUFACTURING MACHINE
    Publication number: 20200242496
    Abstract: Determining a quality score for a part manufactured by an additive manufacturing machine based on build parameters and sensor data without the need for extensive physical testing of the part. Sensor data is received from the additive manufacturing machine during manufacture of the part using a first set of build parameters. The first set of build parameters is received. A first algorithm is applied to the first set of build parameters and the received sensor data to generate a quality score. The first algorithm is trained by receiving a reference derived from physical measurements performed on at least one reference part built using a reference set of build parameters. The quality score is output via the communication interface of the device.
    Type: Application
    Filed: January 25, 2019
    Publication date: July 30, 2020
    Inventors: Lembit SALASOO, Vipul K. GUPTA, Xiaohu PING, Subhrajit ROYCHOWDHURY, Justin GAMBONE, JR., Naresh IYER, Xiaolei SHI, Mengli WANG