Abstract: A test point circuit includes a main RF signal path (e.g., transmission line, lumped-element network, etc.), a test point RF signal circuit, a test point structure having a center conductor and corresponding grounded sleeve and being configured for connecting to a test probe for monitoring the RF signal carried through the main RF signal path, and a switch between the main RF signal path and the test point RF signal circuit. In the open position of the switch, the signal in the main RF signal path is prevented from propagating to the center conductor of the test point structure. In the closed position of the switch, the RF signal can propagate from the main RF signal path to the center conductor of the test point structure. The test probe mated to the test point structure can then measure or monitor the RF signal carried through the main RF signal path.

Abstract: A test point circuit includes a main RF signal path (e.g., transmission line, lumped-element network, etc.), a test point RF signal circuit, a test point structure having a center conductor and corresponding grounded sleeve and being configured for connecting to a test probe for monitoring the RF signal carried through the main RF signal path, and a switch between the main RF signal path and the test point RF signal circuit. In the open position of the switch, the signal in the main RF signal path is prevented from propagating to the center conductor of the test point structure. In the closed position of the switch, the RF signal can propagate from the main RF signal path to the center conductor of the test point structure. The test probe mated to the test point structure can then measure or monitor the RF signal carried through the main RF signal path.