Abstract: A method of measuring skew between signals from an asynchronous integrated flash memory controller (IFC) includes connecting input/output (I/O) pins of the IFC to cycle based test equipment (ATE). The ATE applies a pattern of test signals as input drive to the IFC. Relative to the test cycle, the earliest delay time at which output signals from all of the I/O pins first correspond with expected results, and the latest delay time at which the output signals still correspond with the expected results are measured. The difference between the latest and the earliest delay times is compared with a limit value and a comparison report is generated.

Abstract: Indeterministic launch of test transactions in a system-on-chip device having asynchronous paths may be avoided by gating test mode bus transactions at the functional (IP) module interface. The gated bus transactions are released using an external trigger in order to control loss of cycle accuracy caused by on-board synchronizers during functional testing. Conventional interfaces can be driven from automatic test equipment and controlled in order to account for PVT variations and achieve deterministic and stable behavior of the device while being tested.

Abstract: A method of measuring skew between signals from an asynchronous integrated flash memory controller (IFC) includes connecting input/output (I/O) pins of the IFC to cycle based test equipment (ATE). The ATE applies a pattern of test signals as input drive to the IFC. Relative to the test cycle, the earliest delay time at which output signals from all of the I/O pins first correspond with expected results, and the latest delay time at which the output signals still correspond with the expected results are measured. The difference between the latest and the earliest delay times is compared with a limit value and a comparison report is generated.