Patents by Inventor Vishnu T. V

Vishnu T. V has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for health monitoring and fault signature identification
    Patent number: 10719774
    Abstract: This disclosure relates generally to health monitoring of systems, and more particularly to monitor health of a system for fault signature identification. The system estimates Health Index (HI) of the system as time series data. By analyzing data corresponding to the estimated HI, the system identifies one or more time windows in which majority of the estimated HI values are low as a low HI window, and one or more time windows in which majority of the estimated HI values are high as a high HI window. Upon identifying a low HI window, which indicates an abnormal behavior of the system being monitored, based on a local Bayesian Network generated for the system being monitored, an Explainability Index (EI) for each sensor is generated, wherein the EI quantifies contribution of the sensor to the low HI. Further, associated component(s) is identified as contributing to abnormal/faulty behavior of the system.
    Type: Grant
    Filed: February 20, 2018
    Date of Patent: July 21, 2020
    Assignee: Tata Consultancy Services Limited
    Inventors: Pankaj Malhotra, Vishnu T V, Narendhar Gugulothu, Lovekesh Vig, Puneet Agarwal, Gautam Shroff
  • METHOD AND SYSTEM FOR HEALTH MONITORING AND FAULT SIGNATURE IDENTIFICATION
    Publication number: 20190057317
    Abstract: This disclosure relates generally to health monitoring of systems, and more particularly to monitor health of a system for fault signature identification. The system estimates Health Index (HI) of the system as time series data. By analyzing data corresponding to the estimated HI, the system identifies one or more time windows in which majority of the estimated HI values are low as a low HI window, and one or more time windows in which majority of the estimated HI values are high as a high HI window. Upon identifying a low HI window, which indicates an abnormal behavior of the system being monitored, based on a local Bayesian Network generated for the system being monitored, an Explainability Index (EI) for each sensor is generated, wherein the EI quantifies contribution of the sensor to the low HI. Further, associated component(s) is identified as contributing to abnormal/faulty behavior of the system.
    Type: Application
    Filed: February 20, 2018
    Publication date: February 21, 2019
    Applicant: Tata Consultancy Services Limited
    Inventors: Pankaj MALHOTRA, Vishnu T. V, Narendhar GUGULOTHU, Lovekesh VIG, Puneet AGARWAL, Gautam ShROFF