Patents by Inventor Vishnu Vardhan Krishnamachari

Vishnu Vardhan Krishnamachari has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8610996
    Abstract: A tunable multiple laser pulse scanning microscope and a method of operating the same is described, applying two pulsed laser beams with distinct wavelengths incident on a scanning spot of a sample to be imaged simultaneously or at a specific time delay. The microscope comprises at least two pulsed laser light sources emitting laser light of distinct wavelengths, an acousto-optic tunable filter (AOTF) for tuning at least one of the laser pulses, a delay stage provided upstream of the AOTF, and an actuator for moving delay stage depending on the time delay. As a result, the wavelength of at least one type of pulses is tuned, and the delay between at least two pulses of distinct wavelengths is adjusted.
    Type: Grant
    Filed: May 6, 2010
    Date of Patent: December 17, 2013
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Vishnu Vardhan Krishnamachari, William C. Hay
  • Patent number: 8488118
    Abstract: An apparatus for the microscopic examination of an object has an illumination system which generates a first illumination light beam and a second illumination light beam. A first polarization filter (28) circularly polarizes the first illumination light beam. A second polarization filter (32) linearly polarizes the second illumination light beam. A modulator (34) allows a modulation of the polarized second illumination light beam. An excitation optical system directs the two illumination light beams onto an object. A detection optical system directs detection light beams emanating from the object onto at least two detector units, a first detector unit detecting a first nonlinear Raman effect and a second detector unit detecting a second nonlinear Raman effect.
    Type: Grant
    Filed: March 15, 2011
    Date of Patent: July 16, 2013
    Assignee: Leica Microsystems CMS GmbH
    Inventor: Vishnu Vardhan Krishnamachari
  • Patent number: 8253937
    Abstract: An optical evaluation method and an apparatus for performing said method are described. First laser pulses of a first type and second laser pulses of a second type that differs from the first type are sent onto a sample to be examined. The sample is hit with first incident light from the two laser pulses in at least one manner of simultaneously, within a very short time lag between the two laser pulses, and a time-correlated manner of the two laser pulses, thereby generating a first optical signal, and hit with second incident light from the two laser pulses, thereby generating a second optical signal. The generated first and second optical signals are detected with at least one detector; and an electronic difference between the first and second optical signals is generated.
    Type: Grant
    Filed: November 25, 2009
    Date of Patent: August 28, 2012
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Vishnu Vardhan Krishnamachari, William C. Hay, Volker Seyfried, Bernd Widzgowski
  • Publication number: 20110273768
    Abstract: A tunable multiple laser pulse scanning microscope and a method of operating the same is described, applying two pulsed laser beams with distinct wavelengths incident on a scanning spot of a sample to be imaged simultaneously or at a specific time delay. The microscope comprises at least two pulsed laser light sources emitting laser light of distinct wavelengths, an acousto-optic tunable filter (AOTF) for tuning at least one of the laser pulses, a delay stage provided upstream of the AOTF, and an actuator for moving delay stage depending on the time delay. As a result, the wavelength of at least one type of pulses is tuned, and the delay between at least two pulses of distinct wavelengths is adjusted.
    Type: Application
    Filed: May 6, 2010
    Publication date: November 10, 2011
    Applicant: LEICA MICROSYSTEMS CMS GMBH
    Inventors: Vishnu Vardhan Krishnamachari, William C. Hay
  • Publication number: 20110222054
    Abstract: An apparatus for the microscopic examination of an object has an illumination system which generates a first illumination light beam and a second illumination light beam. A first polarization filter (28) circularly polarizes the first illumination light beam. A second polarization filter (32) linearly polarizes the second illumination light beam. A modulator (34) allows a modulation of the polarized second illumination light beam. An excitation optical system directs the two illumination light beams onto an object. A detection optical system directs detection light beams emanating from the object onto at least two detector units, a first detector unit detecting a first nonlinear Raman effect and a second detector unit detecting a second nonlinear Raman effect.
    Type: Application
    Filed: March 15, 2011
    Publication date: September 15, 2011
    Applicant: LEICA MICROSYSTEMS CMS GMBH
    Inventor: Vishnu Vardhan Krishnamachari
  • Publication number: 20100134793
    Abstract: An optical evaluation method and an apparatus for performing said method are described. First laser pulses of a first type and second laser pulses of a second type that differs from the first type are sent onto a sample to be examined. The sample is hit with first incident light from the two laser pulses in at least one manner of simultaneously, within a very short time lag between the two laser pulses, and a time-correlated manner of the two laser pulses, thereby generating a first optical signal, and hit with second incident light from the two laser pulses, thereby generating a second optical signal. The generated first and second optical signals are detected with at least one detector; and an electronic difference between the first and second optical signals is generated.
    Type: Application
    Filed: November 25, 2009
    Publication date: June 3, 2010
    Applicant: LEICA MICROSYSTEMS CMS GMBH
    Inventors: Vishnu Vardhan Krishnamachari, William C. Hay, Volker Seyfried, Bernd Widzgowski