Patents by Inventor Vitaly Rubinovich

Vitaly Rubinovich has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7184612
    Abstract: A method and apparatus for parallel processing of data without the need for cross-communication or synchronization between processing nodes is provided. The system is especially suitable for use in a wafer inspection system for the semiconductor industry. Embodiments include scanning a small area of the wafer, and distributing pixel data among a plurality of processing nodes, each of which accept and process an optimal amount of pixel data independently of the other processing nodes, thereby enabling increased throughput without increasing system complexity.
    Type: Grant
    Filed: November 3, 2003
    Date of Patent: February 27, 2007
    Assignee: Applied Materials, Inc.
    Inventors: Ron Naftali, Vitaly Rubinovich
  • Patent number: 6898304
    Abstract: A method and apparatus for parallel processing of data without the need for cross-communication or synchronization between processing nodes is provided. The system is especially suitable for use in a wafer inspection system for the semiconductor industry. Embodiments include scanning a small area of the wafer, and distributing pixel data among a plurality of processing nodes, each of which accept and process an optimal amount of pixel data independently of the other processing nodes, thereby enabling increased throughput without increasing system complexity.
    Type: Grant
    Filed: December 1, 2000
    Date of Patent: May 24, 2005
    Assignee: Applied Materials, Inc.
    Inventors: Ron Naftali, Vitaly Rubinovich
  • Publication number: 20040089824
    Abstract: A method and apparatus for parallel processing of data without the need for cross-communication or synchronization between processing nodes is provided. The system is especially suitable for use in a wafer inspection system for the semiconductor industry. Embodiments include scanning a small area of the wafer, and distributing pixel data among a plurality of processing nodes, each of which accept and process an optimal amount of pixel data independently of the other processing nodes, thereby enabling increased throughput without increasing system complexity.
    Type: Application
    Filed: November 3, 2003
    Publication date: May 13, 2004
    Applicant: APPLIED MATERIALS, INC.
    Inventors: Ron Naftali, Vitaly Rubinovich
  • Publication number: 20020090128
    Abstract: A method and apparatus for parallel processing of data without the need for cross-communication or synchronization between processing nodes is provided. The system is especially suitable for use in a wafer inspection system for the semiconductor industry. Embodiments include scanning a small area of the wafer, and distributing pixel data among a plurality of processing nodes, each of which accept and process an optimal amount of pixel data independently of the other processing nodes, thereby enabling increased throughput without increasing system complexity.
    Type: Application
    Filed: December 1, 2000
    Publication date: July 11, 2002
    Inventors: Ron Naftali, Vitaly Rubinovich
  • Patent number: 6026503
    Abstract: A device and method for interactively debugging a system controlled by a microprocessor. The device continuously monitors the signals passed along the system bus, watching for signals that match interactively defined break conditions and trace conditions. When a breakpoint condition is satisfied, the device causes the system's microprocessor to execute debug code, which either may mediate interactive control of the system by the user or may initiate the execution of a software patch. When a trace condition is satisfied, the device initiates tracing of bus activity. The device is controlled by the user using conventional interactive interface means such as a video terminal or a personal computer.
    Type: Grant
    Filed: August 12, 1997
    Date of Patent: February 15, 2000
    Assignee: Telrad Communication and Electronic Industries Ltd.
    Inventors: Simcha Gutgold, Menachem Honig, Vitaly Rubinovich, Ron Treves, Matias Veisman, Michael Wohlfarth