Patents by Inventor Vito P. Errico

Vito P. Errico has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230028351
    Abstract: A laser patterning alignment method provides a way to position a target at a working distance in a laser patterning system such that fiducial marks on the target are positioned in view of at least three laser patterning system cameras, and with each laser patterning system camera, to locate a fiducial mark on the target and sending location data of the located fiducial mark to a controller, to determine corrections required to align expected fiducial mark locations with the sent fiducial mark location data, and to adjust the laser patterning system with the determined corrections.
    Type: Application
    Filed: October 6, 2022
    Publication date: January 26, 2023
    Applicant: nLIGHT, Inc.
    Inventors: Vito P. Errico, Roger C. Shipman
  • Patent number: 11465232
    Abstract: A laser patterning alignment method provides a way to position a target at a working distance in a laser patterning system such that fiducial marks on the target are positioned in view of at least three laser patterning system cameras, and with each laser patterning system camera, to locate a fiducial mark on the target and sending location data of the located fiducial mark to a controller, to determine corrections required to align expected fiducial mark locations with the sent fiducial mark location data, and to adjust the laser patterning system with the determined corrections.
    Type: Grant
    Filed: April 13, 2020
    Date of Patent: October 11, 2022
    Assignee: nLIGHT, Inc.
    Inventors: Vito P. Errico, Roger C. Shipman
  • Patent number: 10739579
    Abstract: A method includes determining a set of pattern position errors between (i) a set of expected pattern positions of a calibration pattern on a laser target situated in a laser processing field of a laser system and produced based on a set of initial scan optic actuation corrections associated with a scan optic of the laser system and (ii) a set of measured pattern positions of the calibration pattern, determining a set of scan optic actuation rates based on the set of initial scan optic actuation corrections, and updating the set of initial scan optic actuation corrections based on the set of scan optic actuation rates and the set of pattern position errors so as to form a set of updated scan optic actuation corrections that is associated with a reduction of at least a portion of the set of pattern position errors.
    Type: Grant
    Filed: April 18, 2019
    Date of Patent: August 11, 2020
    Assignee: nLIGHT, Inc.
    Inventors: Jay Small, Ken Gross, Vito P. Errico
  • Publication number: 20200238435
    Abstract: A laser patterning alignment method provides a way to position a target at a working distance in a laser patterning system such that fiducial marks on the target are positioned in view of at least three laser patterning system cameras, and with each laser patterning system camera, to locate a fiducial mark on the target and sending location data of the located fiducial mark to a controller, to determine corrections required to align expected fiducial mark locations with the sent fiducial mark location data, and to adjust the laser patterning system with the determined corrections.
    Type: Application
    Filed: April 13, 2020
    Publication date: July 30, 2020
    Applicant: nLIGHT, Inc.
    Inventors: Vito P. Errico, Roger C. Shipman
  • Patent number: 10618131
    Abstract: A laser patterning alignment method provides a way to position a target at a working distance in a laser patterning system such that fiducial marks on the target are positioned in view of at least three laser patterning system cameras, and with each laser patterning system camera, to locate a fiducial mark on the target and sending location data of the located fiducial mark to a controller, to determine corrections required to align expected fiducial mark locations with the sent fiducial mark location data, and to adjust the laser patterning system with the determined corrections.
    Type: Grant
    Filed: June 5, 2014
    Date of Patent: April 14, 2020
    Assignee: nLIGHT, Inc.
    Inventors: Vito P. Errico, Roger C. Shipman
  • Publication number: 20190250398
    Abstract: A method includes determining a set of pattern position errors between (i) a set of expected pattern positions of a calibration pattern on a laser target situated in a laser processing field of a laser system and produced based on a set of initial scan optic actuation corrections associated with a scan optic of the laser system and (ii) a set of measured pattern positions of the calibration pattern, determining a set of scan optic actuation rates based on the set of initial scan optic actuation corrections, and updating the set of initial scan optic actuation corrections based on the set of scan optic actuation rates and the set of pattern position errors so as to form a set of updated scan optic actuation corrections that is associated with a reduction of at least a portion of the set of pattern position errors.
    Type: Application
    Filed: April 18, 2019
    Publication date: August 15, 2019
    Applicant: nLIGHT, Inc.
    Inventors: Jay Small, Ken Gross, Vito P. Errico
  • Patent number: 10295820
    Abstract: A method includes determining a set of pattern position errors between (i) a set of expected pattern positions of a calibration pattern on a laser target situated in a laser processing field of a laser system and produced based on a set of initial scan optic actuation corrections associated with a scan optic of the laser system and (ii) a set of measured pattern positions of the calibration pattern, determining a set of scan optic actuation rates based on the set of initial scan optic actuation corrections, and updating the set of initial scan optic actuation corrections based on the set of scan optic actuation rates and the set of pattern position errors so as to form a set of updated scan optic actuation corrections that is associated with a reduction of at least a portion of the set of pattern position errors.
    Type: Grant
    Filed: January 19, 2017
    Date of Patent: May 21, 2019
    Assignee: nLIGHT, Inc.
    Inventors: Jay Small, Ken Gross, Vito P. Errico
  • Patent number: 10295405
    Abstract: A monitoring system for a multi-laser module includes detectors corresponding to each laser and situated to receive a portion of the associated laser beam uncombined with other beams. Laser characteristics are measured and stored, and in operation are used to identify device failures. A comparator receives a reference value and compares the reference value with a current operational value. If the current value is less that the reference value, a possible failure is indicated. Signal cross-coupling among the detectors is also used to identify undesirable scattering that can be associated with surface contamination or device failure.
    Type: Grant
    Filed: March 24, 2016
    Date of Patent: May 21, 2019
    Assignee: nLIGHT, Inc.
    Inventors: Scott R. Karlsen, Jay Small, Mitch Stanek, Vito P. Errico, Cary S. Kiest
  • Publication number: 20170205623
    Abstract: A method includes determining a set of pattern position errors between (i) a set of expected pattern positions of a calibration pattern on a laser target situated in a laser processing field of a laser system and produced based on a set of initial scan optic actuation corrections associated with a scan optic of the laser system and (ii) a set of measured pattern positions of the calibration pattern, determining a set of scan optic actuation rates based on the set of initial scan optic actuation corrections, and updating the set of initial scan optic actuation corrections based on the set of scan optic actuation rates and the set of pattern position errors so as to form a set of updated scan optic actuation corrections that is associated with a reduction of at least a portion of the set of pattern position errors.
    Type: Application
    Filed: January 19, 2017
    Publication date: July 20, 2017
    Applicant: nLIGHT, Inc.
    Inventors: Jay Small, Ken Gross, Vito P. Errico
  • Publication number: 20160209267
    Abstract: A monitoring system for a multi-laser module includes detectors corresponding to each laser and situated to receive a portion of the associated laser beam uncombined with other beams. Laser characteristics are measured and stored, and in operation are used to identify device failures. A comparator receives a reference value and compares the reference value with a current operational value. If the current value is less that the reference value, a possible failure is indicated. Signal cross-coupling among the detectors is also used to identify undesirable scattering that can be associated with surface contamination or device failure.
    Type: Application
    Filed: March 24, 2016
    Publication date: July 21, 2016
    Applicant: nLIGHT, Inc.
    Inventors: Scott R. Karlsen, Jay Small, Mitch Stanek, Vito P. Errico, Cary S. Kiest
  • Publication number: 20150352664
    Abstract: A laser patterning alignment method provides a way to position a target at a working distance in a laser patterning system such that fiducial marks on the target are positioned in view of at least three laser patterning system cameras, and with each laser patterning system camera, to locate a fiducial mark on the target and sending location data of the located fiducial mark to a controller, to determine corrections required to align expected fiducial mark locations with the sent fiducial mark location data, and to adjust the laser patterning system with the determined corrections.
    Type: Application
    Filed: June 5, 2014
    Publication date: December 10, 2015
    Inventors: Vito P. Errico, Roger C. Shipman