Patents by Inventor Vladimer Kamenov

Vladimer Kamenov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20100079741
    Abstract: A projection objective for use in microlithography, a microlithography projection exposure apparatus with a projection objective, a microlithographic manufacturing method for microstructured components, and a component manufactured under the manufacturing method are disclosed.
    Type: Application
    Filed: November 24, 2009
    Publication date: April 1, 2010
    Applicant: CARL ZEISS SMT AG
    Inventors: Daniel Kraehmer, Vladimer Kamenov, Michael Totzeck
  • Patent number: 6992834
    Abstract: Objective (1, 601), in particular a projection objective for a microlithography projection apparatus, with first birefringent lenses (L108, L109, L129, L130) and with second birefringent lenses (L101–L107, L110–L128). The first lenses (L108, L109, L129, L130) are distinguished from the second lenses (L101–L107, L110–L128) by the lens material used or by the material orientation. After passing through the first lenses (L108, L109, L129, L130) and the second lenses (L101–L107, L110–L128), an outer aperture ray (5, 7) and a principal ray (9) are subject to optical path differences for two mutually orthogonal states of polarization. The difference between these optical path differences is smaller than 25% of the working wavelength. In at least one first lens (L129, L130), the aperture angle of the outer aperture ray (5, 7) is at least 70% of the largest aperture angle occurring for said aperture ray in all of the first lenses (L108, L109, L129, L130) and second lenses (L101–L107, L110–L128).
    Type: Grant
    Filed: March 2, 2005
    Date of Patent: January 31, 2006
    Assignee: Carl Zeiss SMT AG
    Inventors: Michael Totzeck, Vladimer Kamenov, Daniel Kraehmer, Wilhelm Ulrich
  • Publication number: 20050200966
    Abstract: Objective (1, 601), in particular a projection objective for a microlithography projection apparatus, with first birefringent lenses (L108, L109, L129, L130) and with second birefringent lenses (L101-L107, L110-L128). The first lenses (L108, L109, L129, L130) are distinguished from the second lenses (L101-L107, L110-L128) by the lens material used or by the material orientation. After passing through the first lenses (L108, L109, L129, L130) and the second lenses (L101-L107, L110-L128), an outer aperture ray (5, 7) and a principal ray (9) are subject to optical path differences for two mutually orthogonal states of polarization. The difference between these optical path differences is smaller than 25% of the working wavelength. In at least one first lens (L129, L130), the aperture angle of the outer aperture ray (5, 7) is at least 70% of the largest aperture angle occurring for said aperture ray in all of the first lenses (L108, L109, L129, L130) and second lenses (L101-L107, L110-L128).
    Type: Application
    Filed: March 2, 2005
    Publication date: September 15, 2005
    Inventors: Michael Totzeck, Vladimer Kamenov, Daniel Kraehmer, Wilhelm Ulrich