Patents by Inventor Vladimir A. Zilberstein

Vladimir A. Zilberstein has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20150160144
    Abstract: The condition of internal or hidden material layers or interfaces is monitored and used for control of a process that changes a condition of a material system. The material system has multiple component materials, such as layers or embedded constituents, or can be represented with multiple layers to model spatial distributions in the material properties. The material condition changes as a result of a process performed on the material, such as by cold working, or from functional operation. Sensors placed proximate to the test material surface or embedded between material layers are used to monitor a material property using magnetic, electric, or thermal interrogation fields. The sensor responses are converted into states of the material condition, such as temperature or residual stress, typically with a precomputed database of sensor responses.
    Type: Application
    Filed: February 19, 2015
    Publication date: June 11, 2015
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, Ian C. Shay, Christopher A. Craven, David C. Grundy, Volker Weiss, Andrew P. Washabaugh
  • Patent number: 8981018
    Abstract: The condition of internal or hidden material layers or interfaces is monitored and used for control of a process that changes a condition of a material system. The material system has multiple component materials, such as layers or embedded constituents, or can be represented with multiple layers to model spatial distributions in the material properties. The material condition changes as a result of a process performed on the material, such as by cold working, or from functional operation. Sensors placed proximate to the test material surface or embedded between material layers are used to monitor a material property using magnetic, electric, or thermal interrogation fields. The sensor responses are converted into states of the material condition, such as temperature or residual stress, typically with a precomputed database of sensor responses.
    Type: Grant
    Filed: March 14, 2005
    Date of Patent: March 17, 2015
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, Ian C. Shay, Christopher A. Craven, David C. Grundy, Volker Weiss, Andrew P. Washabaugh
  • Patent number: 8768657
    Abstract: Predicting the remaining life of individual aircraft, fleets of aircraft, aircraft components and subpopulations of these components. This is accomplished through the use of precomputed databases of response that are generated from a model for the nonlinear system behavior prior to the time that decisions need to be made concerning the disposition of the system. The database is calibrated with a few data points, to account for unmodeled system variables, and then used with an input variable to predict future system behavior. These methods also permit identification of the root causes for observed system behavior. The use of the response databases also permits rapid estimations of uncertainty estimates for the system behavior, such as remaining life estimates, particularly, when subsets of an input variable distribution are passed through the database and scaled appropriately to construct the output distribution.
    Type: Grant
    Filed: January 12, 2007
    Date of Patent: July 1, 2014
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, Volker Weiss, Yanko K. Sheiretov
  • Patent number: 8494810
    Abstract: A framework for adaptively managing the life of components. A sensor provides non-destructive test data obtained from inspecting a component. The inspection data may be filtered using reference signatures and by subtracting a baseline. The filtered inspection data and other inspection data for the component is analyzed to locate flaws and estimate the current condition of the component. The current condition may then be used to predict the component's condition at a future time or to predict a future time at which the component's condition will have deteriorated to a certain level. A current condition may be input to a precomputed database to look up the future condition or time. The future condition or time is described by a probability distribution which may be used to assess the risk of component failure. The assessed risk may be used to determine whether the part should continue in service, be replaced or repaired.
    Type: Grant
    Filed: June 7, 2010
    Date of Patent: July 23, 2013
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Yanko K. Sheiretov, Andrew P. Washabaugh, Vladimir A. Zilberstein, David C. Grundy, Robert J. Lyons, David A. Jablonski, Floyd W. Spencer
  • Patent number: 8237433
    Abstract: Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.
    Type: Grant
    Filed: January 19, 2011
    Date of Patent: August 7, 2012
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Ian C. Shay, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein
  • Publication number: 20110163742
    Abstract: Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.
    Type: Application
    Filed: January 19, 2011
    Publication date: July 7, 2011
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Ian C. Shay, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein
  • Publication number: 20110060568
    Abstract: A framework for adaptively managing the life of components. A sensor provides non-destructive test data obtained from inspecting a component. The inspection data may be filtered using reference signatures and by subtracting a baseline. The filtered inspection data and other inspection data for the component is analyzed to locate flaws and estimate the current condition of the component. The current condition may then be used to predict the component's condition at a future time or to predict a future time at which the component's condition will have deteriorated to a certain level. A current condition may be input to a precomputed database to look up the future condition or time. The future condition or time is described by a probability distribution which may be used to assess the risk of component failure. The assessed risk may be used to determine whether the part should continue in service, be replaced or repaired.
    Type: Application
    Filed: June 7, 2010
    Publication date: March 10, 2011
    Applicant: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Yanko K. Sheiretov, Andrew P. Washabaugh, Vladimir A. Zilberstein, David C. Grundy, Robert J. Lyons, David A. Jablonski, Floyd W. Spencer
  • Patent number: 7876094
    Abstract: Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.
    Type: Grant
    Filed: April 4, 2008
    Date of Patent: January 25, 2011
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Ian C. Shay, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein, Vladimir Tsukernik
  • Patent number: 7696748
    Abstract: Methods and apparatus are described for absolute electrical property measurement of materials. This is accomplished with magnetic and electric field based sensors and sensor array geometries that can be modeled accurately and with impedance instrumentation that permits accurate measurements of the in-phase and quadrature phase signal components. A dithering calibration method is also described which allows the measurement to account for background material noise variations. Methods are also described for accounting for noise factors in sensor design and selection of the optimal operating conditions which can minimize the error bounds for material property estimates. Example application of these methods to automated engine disk slot inspection and assessment of the mechanical condition of dielectric materials are presented.
    Type: Grant
    Filed: October 12, 2004
    Date of Patent: April 13, 2010
    Assignee: Jentek Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein, Andrew P. Washabaugh, Vladimir Tsukernik, Mark D. Windoloski, Ian C. Shay
  • Publication number: 20100045277
    Abstract: Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.
    Type: Application
    Filed: April 4, 2008
    Publication date: February 25, 2010
    Inventors: Neil J. Goldfine, Ian C. Shay, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein, Vladimir Tsukernik
  • Patent number: 7533575
    Abstract: Magnetic or electric field sensors are mounted against a material surface and used for stress, strain, and load monitoring of rotating components such as vehicle drive trains. The stationary sensors are mounted at multiple locations around the component and used assess the stress on the component at multiple rotational positions. The sensor response is typically converted into a material property, such as magnetic permeability or electrical conductivity, which accounts for any coating thickness that may be present between the sensor and mounting surface. The sensors are not in direct contact with the rotating component and are typically mounted on an annular material or ring that encircles the rotating component. Measurements of the annular material properties, such as the stress, are related to the stress on the rotating component and discrete features on the component.
    Type: Grant
    Filed: February 5, 2007
    Date of Patent: May 19, 2009
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, David C. Grundy, Yanko K. Sheiretov, Leandro M. Lorilla, Vladimir A. Zilberstein, Volker Weiss, J. Timothy Lovett, Andrew P. Washabaugh
  • Patent number: 7526964
    Abstract: Methods are described for the use of conformable eddy-current sensors and sensor arrays for characterizing residual stresses and applied loads in materials. In addition, for magnetizable materials such as steels, these methods can be used to determine carbide content and to inspect for grinding burn damage. The sensor arrays can be mounted inside or scanned across the inner surface of test articles and hollow fasteners to monitor stress distributions. A technique for placing eddy-current coils around magnetizable fasteners for load distribution monitoring is also disclosed.
    Type: Grant
    Filed: January 24, 2003
    Date of Patent: May 5, 2009
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, James M. Fisher, David C. Grundy, Darrell E. Schlicker, Vladimir Tsukernik, Robert J. Lyons, Ian C. Shay, Andrew P. Washabaugh
  • Patent number: 7518360
    Abstract: Combined wound and micro-fabricated winding constructs are described for the inspection of materials and the detection and characterization of hidden features or flaws. These constructs can be configured as sensors or sensor arrays that are surface mounted or scanned over conducting and/or magnetizable test materials. The well-defined geometry obtained micro-fabricated windings and from carefully wound coils with known winding positions permits the use of model based inversions of sensed responses into material properties. In a preferred embodiment, the primary winding is a wound coil and the sense elements are etched or printed. The drive or sense windings can also be mounted under fasteners to improve sensitivity to hidden flaws. Ferrites and other means may be used to guide the magnetic flux and enhance the magnetic field in the test material.
    Type: Grant
    Filed: June 1, 2007
    Date of Patent: April 14, 2009
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Andrew P. Washabaugh, Ian C. Shav, Mark D. Windoloski, Christopher Root, Vladimir A. Zilberstein, David C. Grundy, Vladimir Tsukernik
  • Patent number: 7451657
    Abstract: Methods are described for assessing material condition. These methods include the use of multiple source fields for interrogating and loading of a multicomponent test material. Source fields include electric, magnetic, thermal, and acoustic fields. The loading field preferentially changes the material properties of a component of the test material, which allows the properties of the component materials to be separated. Methods are also described for monitoring changes in material state using separate drive and sense electrodes with some of the electrodes positioned on a hidden or even embedded material surface. Statistical characterization of the material condition is performed with sensor arrays that provide multiple responses for the material condition during loading. The responses can be combined into a statistical population that permits tracking with respect to loading history.
    Type: Grant
    Filed: January 14, 2005
    Date of Patent: November 18, 2008
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Vladimir A. Zilberstein, Andrew P. Washabaugh, Volker Weiss, Christopher A. Craven, Ian C. Shay, David C. Grundy, Karen E. Walrath, Robert J. Lyons
  • Publication number: 20080258720
    Abstract: Combined wound and micro-fabricated winding constructs are described for the inspection of materials and the detection and characterization of hidden features or flaws. These constructs can be configured as sensors or sensor arrays that are surface mounted or scanned over conducting and/or magnetizable test materials. The well-defined geometry obtained micro-fabricated windings and from carefully wound coils with known winding positions permits the use of model based inversions of sensed responses into material properties. In a preferred embodiment, the primary winding is a wound coil and the sense elements are etched or printed. The drive or sense windings can also be mounted under fasteners to improve sensitivity to hidden flaws. Ferrites and other means may be used to guide the magnetic flux and enhance the magnetic field in the test material.
    Type: Application
    Filed: June 1, 2007
    Publication date: October 23, 2008
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Andrew P. Washabaugh, Ian C. Shav, Mark D. Windoloski, Christopher Root, Vladimir A. Zilberstein, David C. Grundy, Vladimir Tsukernik
  • Patent number: 7348771
    Abstract: Sensor condition verification may be performed on electromagnetic sensors and sensor arrays mounted to a material surface. The sensors typically have a periodic winding or electrode structure that creates a periodic sensing field when driven by an electrical signal. The sensors can be thin and flexible so that they conform to the surface of the test material. Monitoring the conductivity changes of a test material, with changes in temperature, may provide a mechanism for testing the integrity of the sensor. Changes in the conductivity, due to changes in temperature, without significant lift-off changes may verify the calibration of the sensor and that the sensor elements themselves are intact.
    Type: Grant
    Filed: September 18, 2006
    Date of Patent: March 25, 2008
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Karen E. Walrath, Andrew P. Washabaugh, Vladimir A. Zilberstein, Vladimir Tsukemik
  • Publication number: 20070245834
    Abstract: Magnetic or electric field sensors are mounted against a material surface and used for stress, strain, and load monitoring of rotating components such as vehicle drive trains. The stationary sensors are mounted at multiple locations around the component and used assess the stress on the component at multiple rotational positions. The sensor response is typically converted into a material property, such as magnetic permeability or electrical conductivity, which accounts for any coating thickness that may be present between the sensor and mounting surface. The sensors are not in direct contact with the rotating component and are typically mounted on an annular material or ring that encircles the rotating component. Measurements of the annular material properties, such as the stress, are related to the stress on the rotating component and discrete features on the component.
    Type: Application
    Filed: February 5, 2007
    Publication date: October 25, 2007
    Inventors: Neil Goldfine, Darrell Schlicker, David Grundy, Yonko Sheiretov, Leandro Lorilla, Vladimir Zilberstein, Volker Weiss, J. Lovett, Andrew Washabaugh
  • Publication number: 20070239407
    Abstract: Predicting the remaining life of individual aircraft, fleets of aircraft, aircraft components and subpopulations of these components. This is accomplished through the use of precomputed databases of response that are generated from a model for the nonlinear system behavior prior to the time that decisions need to be made concerning the disposition of the system. The database is calibrated with a few data points, to account for unmodeled system variables, and then used with an input variable to predict future system behavior. These methods also permit identification of the root causes for observed system behavior. The use of the response databases also permits rapid estimations of uncertainty estimates for the system behavior, such as remaining life estimates, particularly, when subsets of an input variable distribution are passed through the database and scaled appropriately to construct the output distribution.
    Type: Application
    Filed: January 12, 2007
    Publication date: October 11, 2007
    Inventors: Neil Goldfine, Vladimir Zilberstein, Volker Weiss, Yanko Sheiretov
  • Patent number: 7280940
    Abstract: The condition of insulating and semiconducting dielectric materials is assessed by a sensor array that uses electric fields to interrogate the test material. The sensor has a linear array of parallel drive conductors interconnected to form a single drive electrode and sense conductors placed on each side of and parallel to a drive conductor. Subsets of the sense conductors are interconnected to form at least two sense elements sensitive to different material regions. The sense conductors may be at different distances to the drive conductors, enabling measurement sensitivity to different depths into the test material. The material condition is assessed directly from the sense element responses or after conversion to an effective material property, such as an electrical conductivity or dielectric permittivity.
    Type: Grant
    Filed: March 7, 2006
    Date of Patent: October 9, 2007
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Yanko K Sheiretov, Andrew P. Washabaugh, David C. Grundy, Vladimir A. Zilberstein
  • Publication number: 20070227255
    Abstract: Observability of damage precursor, damage and usage states, or event occurrence may be enhanced by modifying component materials to include self-monitoring materials or by processing test material to alter the surface properties. The properties of the self monitoring materials, such as magnetic permeability or electrical conductivity, are monitored with electromagnetic sensors and provide greater property variations with component condition than the original component material. Processing includes shot peening or laser welding.
    Type: Application
    Filed: January 25, 2007
    Publication date: October 4, 2007
    Inventors: Neil Goldfine, Vladimir Zilberstein, David Grundy, Andrew Washabaugh, Darrell Schlicker, Ian Shay, Robert Lyons, Christopher Craven, Christopher Root, Mark Windoloski, Volker Weiss