Patents by Inventor VLADIMIR LITOVCHENKO

VLADIMIR LITOVCHENKO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Integrated circuit device and method therefor
    Patent number: 9435862
    Abstract: An integrated circuit device comprising at least one self-test component arranged to execute self-testing within at least one self-test structure during a self-test execution phase of the IC device, and at least one clock control component arranged to provide at least one clock signal to the at least one self-test component at least during the self-test execution phase of the IC device. The at least one clock control component is further arranged to receive at least one indication of at least one power dissipation parameter for at least a part of the IC device, and modulate the at least one clock signal provided to the at least one self-test component based at least partly on the received at least one power dissipation parameter for at least a part of the IC device.
    Type: Grant
    Filed: July 14, 2014
    Date of Patent: September 6, 2016
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Vladimir Litovchenko, Heiko Ahrens, Andreas Roland Stahl
  • INTEGRATED CIRCUIT DEVICE AND METHOD THEREFOR
    Publication number: 20160011259
    Abstract: An integrated circuit device comprising at least one self-test component arranged to execute self-testing within at least one self-test structure during a self-test execution phase of the IC device, and at least one clock control component arranged to provide at least one clock signal to the at least one self-test component at least during the self-test execution phase of the IC device. The at least one clock control component is further arranged to receive at least one indication of at least one power dissipation parameter for at least a part of the IC device, and modulate the at least one clock signal provided to the at least one self-test component based at least partly on the received at least one power dissipation parameter for at least a part of the IC device.
    Type: Application
    Filed: July 14, 2014
    Publication date: January 14, 2016
    Applicant: FREESCALE SEMICONDUCTOR, INC.
    Inventors: VLADIMIR LITOVCHENKO, HEIKO AHRENS, ANDREAS ROLAND STAHL