Patents by Inventor Vladimir P. Rozenfeld

Vladimir P. Rozenfeld has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8978004
    Abstract: A layout of a standard cell is created by prioritizing routability characteristics of the standard cell layout. The routability characteristics are prioritized so that the characteristics that are more likely to enhance routing efficiency are emphasized in the cell layout. The prioritization of the routability characteristics can be indicated by a set of weights, with each weight in the set indicating the priority of a corresponding routability characteristic of the standard cell layout. The weights can be used to calculate a weighted sum of the routability characteristics of the standard cell, thereby providing a way to efficiently compare the routability of different standard cell layouts.
    Type: Grant
    Filed: June 21, 2012
    Date of Patent: March 10, 2015
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Robert L. Maziasz, Alexander L. Kerre, Vladimir P. Rozenfeld, Mikhail A. Sotnikov, Igor G. Topouzov
  • Patent number: 8726218
    Abstract: A layout tool partially replicates the layout of a base cell to determine the layout for a target cell. The base cell is information representing an arrangement of a set of transistors having an established layout. The target cell is information indicating the desired arrangement of another set of transistors. The layout tool identifies correspondences between subsets of the base cell transistors and subsets of the target cell transistors and replicates the layout of the identified base cell subsets to determine the layout for the identified target cell subsets. In addition, the layout tool can identify base cell subsets that closely match target cell subsets, but for which the layout cannot be exactly replicated because of obstructions in the target cell subsets. For such identified base cell subsets, the layout tool can determine a layout by adjusting the base cell subset layouts to avoid the obstructions.
    Type: Grant
    Filed: February 16, 2012
    Date of Patent: May 13, 2014
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Robert L. Maziasz, Vladimir P. Rozenfeld, Iouri G. Smirnov, Alexander V. Zhuravlev
  • Publication number: 20130212549
    Abstract: A layout of a standard cell is created by prioritizing routability characteristics of the standard cell layout. The routability characteristics are prioritized so that the characteristics that are more likely to enhance routing efficiency are emphasized in the cell layout. The prioritization of the routability characteristics can be indicated by a set of weights, with each weight in the set indicating the priority of a corresponding routability characteristic of the standard cell layout. The weights can be used to calculate a weighted sum of the routability characteristics of the standard cell, thereby providing a way to efficiently compare the routability of different standard cell layouts.
    Type: Application
    Filed: June 21, 2012
    Publication date: August 15, 2013
    Applicant: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Robert L. Maziasz, Alexander L. Kerre, Vladimir P. Rozenfeld, Mikhail A. Sotnikov, Igor G. Topouzov
  • Publication number: 20120159412
    Abstract: A layout tool partially replicates the layout of a base cell to determine the layout for a target cell. The base cell is information representing an arrangement of a set of transistors having an established layout. The target cell is information indicating the desired arrangement of another set of transistors. The layout tool identifies correspondences between subsets of the base cell transistors and subsets of the target cell transistors and replicates the layout of the identified base cell subsets to determine the layout for the identified target cell subsets. In addition, the layout tool can identify base cell subsets that closely match target cell subsets, but for which the layout cannot be exactly replicated because of obstructions in the target cell subsets. For such identified base cell subsets, the layout tool can determine a layout by adjusting the base cell subset layouts to avoid the obstructions.
    Type: Application
    Filed: February 16, 2012
    Publication date: June 21, 2012
    Applicant: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Robert L. Maziasz, Vladimir P. Rozenfeld, Iouri G. Smirnov, Alexander V. Zhuravlev
  • Patent number: 7721245
    Abstract: A method, data processing system, and computer program product are provided for routing a circuit placement a number of times, resulting in a number of routings. An electromigration quality value is computed for each of the routings, and the routing with the best electromigration quality value is selected. In one embodiment, each routing is analyzed with attention to the current that passes through each of the routing's segments in order to compute a current distribution that is used to compute a routing quality vector. In another embodiment, multiple placements are generated and the electromigration placement quality vectors are computed for the various placements with the placement with the best electromigration quality vector being selected. In one embodiment, the placement with the best electromigration quality vector is routed the number of times to determine the routing with the lowest (best) electromigration quality value.
    Type: Grant
    Filed: June 11, 2007
    Date of Patent: May 18, 2010
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Robert L. Maziasz, Vladimir P. Rozenfeld, Iouri Smirnov, Sergei V. Somov, Igor G. Topouzov, Lyudmila Zinchenko
  • Publication number: 20080092100
    Abstract: A method, data processing system, and computer program product are provided for routing a circuit placement a number of times, resulting in a number of routings. An electromigration quality value is computed for each of the routings, and the routing with the best electromigration quality value is selected. In one embodiment, each routing is analyzed with attention to the current that passes through each of the routing's segments in order to compute a current distribution that is used to compute a routing quality vector. In another embodiment, multiple placements are generated and the electromigration placement quality vectors are computed for the various placements with the placement with the best electromigration quality vector being selected. In one embodiment, the placement with the best electromigration quality vector is routed the number of times to determine the routing with the lowest (best) electromigration quality value.
    Type: Application
    Filed: June 11, 2007
    Publication date: April 17, 2008
    Inventors: Robert L. Maziasz, Vladimir P. Rozenfeld, Iouri Smirnov, Sergei V. Somov, Igor G. Topouzov, Lyudmila Zinchenko