Patents by Inventor Vladimir Pobortchi

Vladimir Pobortchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical measurement method and device
    Patent number: 7408635
    Abstract: An optical measurement of a crystalline sample to be measured. The sample is irradiated with an exciting light from the polarization direction in which the Raman scattering is prohibited by the selection rule. When a metal probe is brought to proximity to the sample to be measured, the selection rule is eased locally only in the proximity portion near the probe end in order that Raman scattering becomes active. Thus, a Raman signal only from the proximity portion near the probe end is detected. An optical measurement apparatus having an optical arrangement for measuring a signal light re-emitted from a sample to be measured when the sample is irradiated with an exciting light is provided. The optical measurement apparatus comprises a means for limiting the polarization state of the exciting light or signal light and a means for bringing a metal probe near the sample to be measured.
    Type: Grant
    Filed: September 3, 2004
    Date of Patent: August 5, 2008
    Assignee: National Institute of Advanced Industrial Science and Technology
    Inventors: Vladimir Pobortchi, Toshihiko Kanayama, Tetsuya Tada
  • Optical measurement method and device
    Publication number: 20070013907
    Abstract: An optical measurement of a crystalline sample to be measured. The sample is irradiated with an exciting light from the polarization direction in which the Raman scattering is prohibited by the selection rule. When a metal probe is brought to proximity to the sample to be measured, the selection rule is eased locally only in the proximity portion near the probe end in order that Raman scattering becomes active. Thus, a Raman signal only from the proximity portion near the probe end is detected. An optical measurement apparatus having an optical arrangement for measuring a signal light re-emitted from a sample to be measured when the sample is irradiated with an exciting light is provided. The optical measurement apparatus comprises a means for limiting the polarization state of the exciting light or signal light and a means for bringing a metal probe near the sample to be measured.
    Type: Application
    Filed: September 3, 2004
    Publication date: January 18, 2007
    Inventors: Vladimir Pobortchi, Toshihiko Kanayama, Tetsuya Tada