Patents by Inventor Vladimir Ponkratov

Vladimir Ponkratov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9285214
    Abstract: Position detector for determining the rotation angle position of a rotatably supported object, comprising a light source for producing a light beam, a diffraction grating, a mirror which is connected with the object in a co-rotating manner in such a way that the light beam is reflected therefrom onto the diffraction grating and passes over the diffraction grating during a rotation of the mirror, thereby producing diffraction light, an interference device which is configured such as to be able to bring different diffraction orders of the diffraction light to interference, thereby producing an interference pattern, a light detector by means of which a brightness course, caused by the passing over of the diffraction grating with the reflected light beam, of the interference pattern can be detected, and an evaluation unit by which the rotation angle position of the object can be determined based on the brightness course.
    Type: Grant
    Filed: May 2, 2012
    Date of Patent: March 15, 2016
    Assignee: SCANLAB AG
    Inventors: Norbert Petschik, Vladimir Ponkratov, Martin Valentin, Hans-Joachim Münzer
  • Publication number: 20140132962
    Abstract: Position detector for determining the rotation angle position of a rotatably supported object, comprising a light source for producing a light beam, a diffraction grating, a mirror which is connected with the object in a co-rotating manner in such a way that the light beam is reflected therefrom onto the diffraction grating and passes over the diffraction grating during a rotation of the mirror, thereby producing diffraction light, an interference device which is configured such as to be able to bring different diffraction orders of the diffraction light to interference, thereby producing an interference pattern, a light detector by means of which a brightness course, caused by the passing over of the diffraction grating with the reflected light beam, of the interference pattern can be detected, and an evaluation unit by which the rotation angle position of the object can be determined based on the brightness course.
    Type: Application
    Filed: May 2, 2012
    Publication date: May 15, 2014
    Applicant: SCANLAB AG
    Inventors: Norbert Petschik, Vladimir Ponkratov, Martin Valentin, Hans-Joachim Münzer