Abstract: In a method of X-radiation sorting of raw materials, after the stock lumps have been spread in monolayer on the transporting surface and stabilized, they are brought into the mode of unsupported movement along the stabilized paths without rotation. The exposure of the lumps to X-radiation, the measurement of the secondary radiation from the lumps, and the selection thereof are all carried out during this unsupported movement of the lumps. An apparatus for X-radiation sorting of raw materials comprises a steeply inclined vibrating feeder (4) conjugate to a preceding slightly inclined vibrating feeder (3) with a stabilizer (5) located thereabove for stabilizing the lumps of the stock. Over a section (14) of joining the conjugate vibrating feeders (3,4), there is disposed a second stabilizer (6) compensating for the lump torques produced at the point where the lumps pass onto the vibrating feeder (4).

Abstract: The present invention relates to ionizing radiation sensors, and, more particularly, to semiconductor spectrometers with thermoelectric cooling, and can most advantageously be used in mineral raw material exploration and evaluation under field conditions. The spectrometer comprises a vacuum chamber with an entrance window for passing the radiation therethrough. The vacuum chamber accommodates a thermoelectric cooler formed by a set of Peltier elements. A heat conducting plate is mounted on the cold side of the thermoelectric cooler, and its hot side is provided with a radiator. Mounted on the heat conducting plate are sets of Peltier elements, integral with the thermoelectric cooler and independent of one another. The Peltier elements of these sets are stacked so as to develop the minimum temperature conditions on one set carrying a semiconductor detector and to provide the maximum refrigeration capacity conditions on the other set provided with the field-effect transistor mounted thereon.