Patents by Inventor Vladimir Slastion

Vladimir Slastion has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8581781
    Abstract: An interferometer estimates at least one interferometric parameter of one or more signals emitted from a source. The interferometer has an array of antennas and at least one phase detector configured to determine a plurality of phase measurements of the one or more source signals. A combined estimator processes the plurality of phase measurements to provide estimates of at least one sought parameter, representing the at least one interferometric parameter, and at least one noise parameter associated with the plurality of phase measurements. A postprocessor processes estimates of the at least one sought parameter based on at least one noise parameter received from the combined estimator to improve an estimate of the at least one interferometric parameter. The combined estimator is configurable to produce a maximum likelihood estimate of the at least one sought parameter using at least one noise parameter calculated based on the plurality of phase measurements.
    Type: Grant
    Filed: February 17, 2011
    Date of Patent: November 12, 2013
    Inventor: Vladimir Slastion
  • Publication number: 20110208481
    Abstract: An interferometer estimates at least one interferometric parameter of one or more signals emitted from a source. The interferometer includes at least one phase measurement module for measuring phase differences between the source signals received at different signal receiving sensors. At least one coarse estimate of a sought parameter used to represent the at least one interferometric parameter is generated by processing the one or more signals received from the source. At least one fine estimate of the sought parameter is also generated by processing the at least one coarse sought parameter using the plurality of phase measurements received from the at least one phase measurement module. The at least one fine sought parameter represents the at least one interferometric parameter with greater accuracy than the at least one coarse sought parameter and over an extended range of values in which the sought parameter is not unambiguously determinable using only the plurality of phase measurements.
    Type: Application
    Filed: February 17, 2011
    Publication date: August 25, 2011
    Inventor: Vladimir Slastion
  • Publication number: 20110205123
    Abstract: An interferometer estimates at least one interferometric parameter of one or more signals emitted from a source. The interferometer has an array of antennas and at least one phase detector configured to determine a plurality of phase measurements of the one or more source signals. A combined estimator processes the plurality of phase measurements to provide estimates of at least one sought parameter, representing the at least one interferometric parameter, and at least one noise parameter associated with the plurality of phase measurements. A postprocessor processes estimates of the at least one sought parameter based on at least one noise parameter received from the combined estimator to improve an estimate of the at least one interferometric parameter. The combined estimator is configurable to produce a maximum likelihood estimate of the at least one sought parameter using at least one noise parameter calculated based on the plurality of phase measurements.
    Type: Application
    Filed: February 17, 2011
    Publication date: August 25, 2011
    Inventor: Vladimir Slastion