Patents by Inventor Volker Leimbach

Volker Leimbach has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200233196
    Abstract: A microscopy arrangement includes a holding apparatus having an instrument platform, a holding element which is rigidly connected thereto and to a microscope and a support element configured to support the instrument platform on a main platform at a distance therefrom. In a vertical projection, the holding apparatus at least does not completely overlap with the microscope supported by the holding element. The support element has a changeable height such that the instrument platform is positionable at a changeable vertical distance from the main platform and/or a height-changeable microscope stage places an object plane that is defined by the microscope stage at a changeable vertical distance such that a vertical extent of an object region is changeable. The laser beams remain in a fixed relationship with one another in time and/or space, even in the case of a change in the vertical extent of the object region.
    Type: Application
    Filed: August 16, 2018
    Publication date: July 23, 2020
    Inventors: Werner Knebel, Volker Leimbach, Roland Seifert
  • Patent number: 8587865
    Abstract: A device for examining and manipulating microscopic objects with a microscope having a light source that serves to illuminate the object, and which generates an illumination light beam that runs along and illumination beam path, that can be guided over or through the object by means of a beam deflector, with a detector to detect light emitted from the object that runs along the detection beam path, with a primary beam splitter, and with a light source, which generates a manipulation light beam that runs along an illumination beam path, that serves to manipulate the object.
    Type: Grant
    Filed: November 3, 2005
    Date of Patent: November 19, 2013
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Juergen Riedmann, Ingo Boehm, Volker Leimbach, Heinrich Ulrich, Holger Birk
  • Publication number: 20110222147
    Abstract: An apparatus in a simultaneous fluorescence excitation microscope is described, allowing simultaneous fluorescence excitation by light of at least two different wavelengths. The apparatus has a laser light source generating a light beam. A first beam splitter splits the light beam into a first partial light beam and a second partial light beam. A wavelength converter converts the wavelength of the first partial light beam. A microscope optical system into which the first partial light beam and the second partial light beam are coupled directs the two partial light beams onto an object to be examined.
    Type: Application
    Filed: March 15, 2011
    Publication date: September 15, 2011
    Applicant: LEICA MICROSYSTEMS CMS GMBH
    Inventors: Heinrich Ulrich, Volker Leimbach
  • Patent number: 7564624
    Abstract: The invention relates to a microscope comprising at least one first and second light sources, a first light-guiding fiber connected to the first light source and a second light-guiding fiber connected to the second light source, wherein the light emitted by corresponding light source is injectable into the connected light-guiding fiber. The inventive microscope also comprises an objective lens disposed in the illumination beam path and is characterized in that a fiber multiplexer connected to the first and second light-guiding fibers, receiving the light from the light source and selectively allowing the light from the first or second light source to pass is disposed in the illumination beam path.
    Type: Grant
    Filed: June 22, 2005
    Date of Patent: July 21, 2009
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Volker Leimbach, Heinrich Ulrich
  • Patent number: 7457331
    Abstract: An optical arrangement includes a laser, and a chromatic error correcting device arranged in a beam path of the laser. The chromatic error correcting device includes a pulse stretcher.
    Type: Grant
    Filed: October 17, 2005
    Date of Patent: November 25, 2008
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Juergen Riedmann, Volker Leimbach
  • Patent number: 7453578
    Abstract: A 4Pi microscope provided with an interferometer wherein two lenses (31, 33) are arranged in such a way that they are opposite to each other on different sides of a sample plane (35); also comprising an optical element (19) which is used to inject illuminating light (3) into the interferometer and/or used to discharge detection light (41) from the interferometer and to deflect a detection beam path, containing a reflecting means (51) which reflects illuminating light discharged by the optical element back into the interferometer and/or which allows detection light which is deflected onto the deflection beam to pass, also reflecting other discharged detection light which is not deflected onto the detection beam path into the interferometer.
    Type: Grant
    Filed: September 27, 2004
    Date of Patent: November 18, 2008
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Volker Leimbach, Reiner Rygiel
  • Publication number: 20070176085
    Abstract: The invention relates to a microscope comprising at least one first and second light sources, a first light-guiding fiber connected to the first light source and a second light-guiding fiber connected to the second light source, wherein the light emitted by corresponding light source is injectable into the connected light-guiding fiber. The inventive microscope also comprises an objective lens disposed in the illumination beam path and is characterized in that a fiber multiplexer connected to the first and second light-guiding fibers, receiving the light from the light source and selectively allowing the light from the first or second light source to pass is disposed in the illumination beam path.
    Type: Application
    Filed: June 22, 2005
    Publication date: August 2, 2007
    Applicant: LEICA MICROSYSTEMS CMS GMBH
    Inventors: Volker Leimbach, Heinrich Ulrich
  • Publication number: 20070052972
    Abstract: A 4Pi microscope provided with an interferometer wherein two lenses (31, 33) are arranged in such a way that they are opposite to each other on different sides of a sample plane (35); also comprising an optical element (19) which is used to inject illuminating light (3) into the interferometer and/or used to discharge detection light (41) from the interferometer and to deflect a detection beam path, containing a reflecting means (51) which reflects illuminating light discharged by the optical element back into the interferometer and/or which allows detection light which is deflected onto the deflection beam to pass, also reflecting other discharged detection light which is not deflected onto the detection beam path into the interferometer.
    Type: Application
    Filed: September 27, 2004
    Publication date: March 8, 2007
    Applicant: Leica Microsystems CMS GmbH
    Inventors: Volker Leimbach, Reiner Rygiel
  • Publication number: 20060098275
    Abstract: The invention relates to a device for examining and manipulating microscopic objects with a microscope having a light source that serves to illuminate the object, and which generates an illumination light beam that runs along and illumination beam path, that can be guided over or through the object by means of a beam deflector, with a detector to detect light emitted from the object that runs along the detection beam path, with a primary beam splitter, and with a light source, which generates a manipulation light beam that runs along an illumination beam path, that serves to manipulate the object.
    Type: Application
    Filed: November 3, 2005
    Publication date: May 11, 2006
    Applicant: Leica Microsystems CMS GmbH
    Inventors: Juergen Riedmann, Ingo Boehm, Volker Leimbach, Heinrich Ulrich, Holger Birk
  • Publication number: 20060092998
    Abstract: An optical arrangement includes a laser, and a chromatic error correcting device arranged in a beam path of the laser. The chromatic error correcting device includes a pulse stretcher.
    Type: Application
    Filed: October 17, 2005
    Publication date: May 4, 2006
    Applicant: Leica Microsystems CMS GmbH
    Inventors: Juergen Riedmann, Volker Leimbach
  • Publication number: 20020159146
    Abstract: To weaken the light beam (12) in a microscope (100), especially in a scanning microscope, we propose an apparatus for the variable change of the illumination power that is arranged so that a light beam of zero diffraction order (17) emanating from a modulator (13) can be used directly for the purposes of microscopy. The acusto optical modulator (13) is the only element in the microscope influencing the power of light in a variable way.
    Type: Application
    Filed: April 26, 2002
    Publication date: October 31, 2002
    Applicant: Leica Microsystems Heidelberg GmbH
    Inventors: Volker Leimbach, Heinrich Ulrich