Abstract: A puncture probe, comprises a probe support having an end with a probe surface with a plurality of alternately arranged layers of thermoelectric conductive material and insulation formed around said probe support adjacent the probe surface or covering a portion or all of it. At least two pairs of the conductive material layers are in contact at locations which are distinct from each other and they are made of thermoelectric conductive material and form thermocouples, one of these thermocouples being heated either by electric energy of by light energy. The probe surface may be planar at the end and a central portion may be covered by a layer of the insulation. In addition, a conductor film forming an inside covering layer on the probe support may be arranged to join or contact a separate conductive layer which extends downwardly on the outside of an insulation layer into contact with the probe surface.