Patents by Inventor Volodymyr S Khandetskyy

Volodymyr S Khandetskyy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8309024
    Abstract: A system for non-destructive determination of the degree of fluorination in carbon monofluoride (CFx) during the process of CFx synthesis is described. The system includes a measuring generator containing a capacitive sensor for measuring a respective capacitance, a base generator containing a capacitive sensor for measuring a base capacitance, and a processor for determining a difference between the respective capacitance and the base capacitance. The system is configured to determine the degree of fluorination based on the difference between the respective capacitance and the base capacitance.
    Type: Grant
    Filed: April 23, 2009
    Date of Patent: November 13, 2012
    Assignee: Enerize Corporation
    Inventors: Volodymyr I Redko, Elena M Shembel, Volodymyr S Khandetskyy, Dayal T Meshri, Isaac A Angres, Robert Adams, Dmytro Sivtsov, Oxana V Redko, Tymofiy V Pastushkin
  • Patent number: 8284247
    Abstract: The present invention is a method and apparatus for optical detection and size evaluation of through-penetrating defects such as pinholes in moving foil or film. The invention comprises the installation of at least one image capture device at a first given distance over the moving foil surface, placement of at least one elongated light source comprising an infinite number of point-sources that are not in phase, and are emitting light independently from one another under the foil, periodic automatic computer-controlled image capture of the foil surface with image capture devices, automatic transmission of the image captured by each device to a control computer, and processing of the transmitted image data to detect of defect light spot, followed by determination of generalized index of its initial image. This generalize index value is equal to the brightness averaged within the spot multiplied by the area of the spot.
    Type: Grant
    Filed: February 14, 2009
    Date of Patent: October 9, 2012
    Assignee: Enerize Corporation
    Inventors: Volodymyr I Redko, Volodymyr S Khandetskyy, Elena M. Shembel
  • Publication number: 20120235692
    Abstract: A method of non-destructive testing for quality control of powdered materials having dielectric properties based on the use of electromagnetic capacitance techniques.
    Type: Application
    Filed: December 19, 2011
    Publication date: September 20, 2012
    Inventors: Volodymyr I. Redko, Elena M. Shembel, Volodymyr S. Khandetskyy, Dmytro Sivtsov, Tymofiy Pastushkin, Oxana Redko, Bary Wilson
  • Patent number: 8102181
    Abstract: Method and related device intended for rapid non-destructive testing of powdered materials with low electric conductivity such as cement and cement-based compositions through determination of their electrical properties. The invention involves an electromagnetic method, including an electronic circuit for generating an electric field in a capacitance probe that is inserted into the powder to be tested. Electrical properties of powdered materials are determined on the basis of a set of the values for a set of parameters including quality factor (Q-factor), capacitance, dissipation factor, and dielectric permeability of the material. These parameter values can be related to such characteristics as moisture content, particle size, and material composition. The method and device can indicate the differences between the samples with various quantities of unwanted components or reaction products, and the extent of sample aging.
    Type: Grant
    Filed: April 21, 2009
    Date of Patent: January 24, 2012
    Assignee: Enerize Corporation
    Inventors: Volodymyr I Redko, Elena M Shembel, Volodymyr S Khandetskyy, Dmytro I Sivtsov, Tymofiy V Pastushkin, Oxana Redko, Bary Wilson
  • Publication number: 20090267623
    Abstract: The present invention is a method and related automatic system for non-destructive determination of physical-chemical properties of powdered in particular as related to the quality control of powdered materials used in battery industry, for example determination of carbon monofluoride (CFx) degree of fluorination during the process of CFx synthesis.
    Type: Application
    Filed: April 23, 2009
    Publication date: October 29, 2009
    Applicant: Enerize Corporation
    Inventors: Volodymyr I. Redko, Elena M. Shembel, Volodymyr S. Khandetskyy, Dayal T. Meshri, Isaac A. Angres, Robert Adams, Dmytro Sivtsov, Oxana V. Red'ko, Tymofiy V. Pastushkin
  • Publication number: 20090267621
    Abstract: Method and related device intended for rapid non-destructive testing of powdered materials with low electric conductivity such as cement and cement-based compositions through determination of their electrical properties. The invention involves an electromagnetic method, including an electronic circuit for generating an electric field in a capacitance probe that is inserted into the powder to be tested. Electrical properties of powdered materials are determined on the basis of a set of the values for a set of parameters including quality factor (Q-factor), capacitance, dissipation factor, and dielectric permeability of the material. These parameter values can be related to such characteristics as moisture content, particle size, and material composition. The method and device can indicate the differences between the samples with various quantities of unwanted components or reaction products, and the extent of sample ageing.
    Type: Application
    Filed: April 21, 2009
    Publication date: October 29, 2009
    Applicant: Enerize Corporation
    Inventors: Volodymyr I. Redko, Elena M. Shembel, Volodymyr S. Khandetskyy, Dmytro Sivtsov, Tymofiy Pastushkin, Oxana Red'ko, Bary Wallace Wilson
  • Publication number: 20090207244
    Abstract: The present invention is a method and apparatus for optical detection and size evaluation of through-penetrating defects such as pinholes in moving foil or film. The invention comprises the installation of at least one image capture device at a first given distance over the moving foil surface, placement of at least one elongated light source comprising an infinite number of point-sources that are not in phase, and are emitting light independently from one another under the foil, periodic automatic computer-controlled image capture of the foil surface with image capture devices, automatic transmission of the image captured by each device to a control computer, and processing of the transmitted image data to detect of defect light spot, followed by determination of generalized index of its initial image. This generalize index value is equal to the brightness averaged within the spot multiplied by the area of the spot.
    Type: Application
    Filed: February 14, 2009
    Publication date: August 20, 2009
    Applicant: Enerize Corporation
    Inventors: Volodymyr I. Redko, Volodymyr S. Khandetskyy, Elena M. Shembel