Patents by Inventor Voon Yew Aaron THEAN

Voon Yew Aaron THEAN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • PLANAR-STAGGERED ARRAY FOR DCNN ACCELERATORS
    Publication number: 20240028880
    Abstract: A memory device for deep neural network, DNN, accelerators, a method of fabricating a memory device for deep neural network, DNN, accelerators, a method of convoluting a kernel [A] with an input feature map [B] in a memory device for a deep neural network, DNN, accelerator, a memory device for a deep neural network, DNN, accelerator, and a deep neural network, DNN, accelerator.
    Type: Application
    Filed: December 10, 2021
    Publication date: January 25, 2024
    Inventors: Hasita VELURI, Voon Yew Aaron THEAN, Yida LI, Baoshan TANG
  • Method and system for integrity testing of sachets
    Patent number: 11585775
    Abstract: A method and system for integrity testing of sachets. The method comprises the steps of disposing at least a portion of the sachet relative to an electrode structure; applying an AC bias voltage to the electrode structure; measuring an electrical property of the portion of the sachet over a frequency range, and determining the integrity based on the measured electrical property over the frequency range.
    Type: Grant
    Filed: April 24, 2019
    Date of Patent: February 21, 2023
    Assignee: NATIONAL UNIVERSITY OF SINGAPORE
    Inventors: Hari Krishna Salila Vijayalal Mohan, Voon Yew Aaron Thean, Suryakanta Nayak
  • METHOD AND SYSTEM FOR INTEGRITY TESTING OF SACHETS
    Publication number: 20210372961
    Abstract: A method and system for integrity testing of sachets. The method comprises the steps of disposing at least a portion of the sachet relative to an electrode structure; applying an AC bias voltage to the electrode structure; measuring an electrical property of the portion of the sachet over a frequency range, and determining the integrity based on the measured electrical property over the frequency range.
    Type: Application
    Filed: April 24, 2019
    Publication date: December 2, 2021
    Applicant: NATIONAL UNIVERSITY OF SINGAPORE
    Inventors: Hari Krishna SALILA VIJAYALAL MOHAN, Voon Yew Aaron THEAN, Suryakanta NAYAK