Patents by Inventor W. Alan Doolittle

W. Alan Doolittle has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20150207067
    Abstract: Metal oxide structures, devices, and fabrication methods are provided. In addition, applications of such structures, devices, and methods are provided. In some embodiments, an oxide material can include a substrate and a single-crystal epitaxial layer of an oxide composition disposed on a surface of the substrate, where the oxide composition is represented by ABO2 such that A is a lithium cation, B is a cation selected from the group consisting of trivalent transition metal cations, trivalent lanthanide cations, trivalent actinide cations, trivalent p-block cations, and combinations thereof, and O is an oxygen anion. The unit cell of the crystal structure of the oxide composition can be characterized by first layer of a plane of lithium cations and a second layer of a plurality of edge-sharing octahedra having a B cation positioned in a center of each octahedron and an oxygen anion at each corner of each octahedron.
    Type: Application
    Filed: February 5, 2015
    Publication date: July 23, 2015
    Inventors: W. Alan Doolittle, Walter E. Henderson
  • Patent number: 8377518
    Abstract: In-situ flux measurement methods, devices, and systems are provided. According to some embodiments, an in-situ molecular flux device generally comprises a electrically conductive container configured to hold a precursor material, a heat source proximate the electrically conductive container to heat the precursor material to release ions such that an ion current is produced; and a current-measuring device in electrical communication with the electrically conductive container to measure the ion current associated with the heated precursor material. Other embodiments are also claimed and described.
    Type: Grant
    Filed: August 15, 2012
    Date of Patent: February 19, 2013
    Assignee: Georgia Tech Research Corporation
    Inventors: W. Alan Doolittle, Alexander G Carver
  • Patent number: 8360002
    Abstract: In-situ flux measurement methods, devices, and systems are provided. According to some embodiments, an in-situ molecular flux device generally comprises a electrically conductive container configured to hold a precursor material, a heat source proximate the electrically conductive container to heat the precursor material to release ions such that an ion current is produced; and a current-measuring device in electrical communication with the electrically conductive container to measure the ion current associated with the heated precursor material. Other embodiments are also claimed and described.
    Type: Grant
    Filed: August 15, 2012
    Date of Patent: January 29, 2013
    Assignee: Georgia Tech Research Corporation
    Inventors: W. Alan Doolittle, Alexander G Carver
  • Publication number: 20120304927
    Abstract: In-situ flux measurement methods, devices, and systems are provided. According to some embodiments, an in-situ molecular flux device generally comprises a electrically conductive container configured to hold a precursor material, a heat source proximate the electrically conductive container to heat the precursor material to release ions such that an ion current is produced; and a current-measuring device in electrical communication with the electrically conductive container to measure the ion current associated with the heated precursor material. Other embodiments are also claimed and described.
    Type: Application
    Filed: August 15, 2012
    Publication date: December 6, 2012
    Applicant: Georgia Tech Research Corporation
    Inventors: W. Alan Doolittle, Alexander G. Carver
  • Publication number: 20120306508
    Abstract: In-situ flux measurement methods, devices, and systems are provided. According to some embodiments, an in-situ molecular flux device generally comprises a electrically conductive container configured to hold a precursor material, a heat source proximate the electrically conductive container to heat the precursor material to release ions such that an ion current is produced; and a current-measuring device in electrical communication with the electrically conductive container to measure the ion current associated with the heated precursor material. Other embodiments are also claimed and described.
    Type: Application
    Filed: August 15, 2012
    Publication date: December 6, 2012
    Applicant: Georgia Tech Research Corporation
    Inventors: W. Alan Doolittle, Alexander Carver
  • Publication number: 20120280224
    Abstract: Metal oxide structures, devices, and fabrication methods are provided. In addition, applications of such structures, devices, and methods are provided. In some embodiments, an oxide material can include a substrate and a single-crystal epitaxial layer of an oxide composition disposed on a surface of the substrate, where the oxide composition is represented by ABO2 such that A is a lithium cation, B is a cation selected from the group consisting of trivalent transition metal cations, trivalent lanthanide cations, trivalent actinide cations, trivalent p-block cations, and combinations thereof, and O is an oxygen anion. The unit cell of crystal structure of the oxide composition can be characterized by first layer of a plane of lithium cations and a second layer of a plurality of edge-sharing octahedra having a B cation positioned in a center of each octahedron and an oxygen anion at each corner of each octahedron.
    Type: Application
    Filed: June 25, 2010
    Publication date: November 8, 2012
    Applicant: Georgia Tech Research Corporation
    Inventors: W. Alan Doolittle, Alexander G. Carver, Walter Henderson
  • Patent number: 8261690
    Abstract: In-situ flux measurement methods, devices, and systems are provided. According to some embodiments, an in-situ molecular flux device generally comprises a electrically conductive container configured to hold a precursor material, a heat source proximate the electrically conductive container to heat the precursor material to release ions such that an ion current is produced; and a current-measuring device in electrical communication with the electrically conductive container to measure the ion current associated with the heated precursor material. Other embodiments are also claimed and described.
    Type: Grant
    Filed: July 16, 2007
    Date of Patent: September 11, 2012
    Assignee: Georgia Tech Research Corporation
    Inventors: W. Alan Doolittle, Alexander G. Carver
  • Publication number: 20080047487
    Abstract: In-situ flux measurement methods, devices, and systems are provided. According to some embodiments, an in-situ molecular flux device generally comprises a electrically conductive container configured to hold a precursor material, a heat source proximate the electrically conductive container to heat the precursor material to release ions such that an ion current is produced; and a current-measuring device in electrical communication with the electrically conductive container to measure the ion current associated with the heated precursor material. Other embodiments are also claimed and described.
    Type: Application
    Filed: July 16, 2007
    Publication date: February 28, 2008
    Applicant: Georgia Tech Research Corporation
    Inventors: W. Alan Doolittle, Alexander Carver