Patents by Inventor W. Derek Buckley

W. Derek Buckley has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4831640
    Abstract: This invention is directed to an improvement in an x-ray lithography system having an x-ray point source of radiation, a wafer disposed in spaced relationship with respect to the source, and a mask disposed between the source and the wafer whereby radiation from the source passes through the mask to the wafer, said improvement comprising the provision of an x-ray absorbent element mounted between the source and the wafer, said element having a radial absorption gradient profile to compensate for radial flux variation of the x-rays.
    Type: Grant
    Filed: June 19, 1987
    Date of Patent: May 16, 1989
    Assignee: The Perkin-Elmer Corporation
    Inventor: W. Derek Buckley
  • Patent number: 4473777
    Abstract: Disclosed herein is an electron emitter assembly for an electron gun which includes a first emitter ring, a second emitter ring, a power supply, connectors for connecting the power supply to the two electron emitter rings so that heating current flows from the power supply through the rings, and said rings being mounted so that a magnetic field formed by the second ring counteracts the magnetic field formed by the first ring.
    Type: Grant
    Filed: September 29, 1982
    Date of Patent: September 25, 1984
    Assignee: The Perkin-Elmer Corporation
    Inventors: George N. Steinberg, W. Derek Buckley
  • Patent number: 4472824
    Abstract: This invention relates to apparatus for effecting alignment and spacing control of a mask and wafer for use, for example, in x-ray lithography, which includes, in combination, two optical channels for effecting lateral and vertical alignment at two spaced alignment targets respectively on the element, two spaced position sensors located on a line which is oblique with respect to a line joining the two alignment targets, and linkage for maintaining the distances between the position sensors and the element equal one to the other.
    Type: Grant
    Filed: August 4, 1982
    Date of Patent: September 18, 1984
    Assignee: The Perkin-Elmer Corporation
    Inventor: W. Derek Buckley
  • Patent number: 4329410
    Abstract: A method of depositing X-ray absorber patterns on a mask membrane to achieve minimum pattern feature dimensions less than 1 .mu.m. The membrane is covered with an ultraviolet (VU) sensitive photoresist which carries a thin metallic film. The metallic film is coated with an electron beam resist. The electron beam resist is exposed to the desired pattern by an electron beam. After development, the metal film is etched through the remaining electron beam resist. This forms a stencil overlying the lower UV photoresist layer which is then exposed by an ultraviolet or soft X-ray source. After development, an X-ray absorber, such as gold, is deposited on the membrane. The final exposure step may be done by means of a point source of radiation. The X-ray absorbers will then have sloping walls to prevent shadowing of the X-ray source.
    Type: Grant
    Filed: December 26, 1979
    Date of Patent: May 11, 1982
    Assignee: The Perkin-Elmer Corporation
    Inventor: W. Derek Buckley