Patents by Inventor W. Eugen Hill

W. Eugen Hill has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for using emission microscopy in physical verification of memory device architecture
    Patent number: 6941529
    Abstract: A method and system for verifying an architecture of a semiconductor device is disclosed. The method and system include providing a tester, a detector and an image processing unit. The tester applies at least one voltage to at least one selected portion of the semiconductor device. The at least one voltage is sufficient for the at least one selected portion of the semiconductor device to produce a particular level of radiation. The detector detects the radiation. The image processing unit is coupled with the detector and the tester. The image processing unit captures an image from the detector. The image indicates at least one physical location of the at least one selected portion of the semiconductor device. The architecture of the memory device can be verified by comparing the at least one selected portion of the semiconductor device to the at least one physical location.
    Type: Grant
    Filed: November 5, 2002
    Date of Patent: September 6, 2005
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Shivananda Shetty, W. Eugen Hill, Mehrdad Mahanpour