Patents by Inventor Wade Joseph HAGMAN

Wade Joseph HAGMAN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10962483
    Abstract: A device and method to reduce molecular background emission and to increase matrix management in solution cathode glow discharge (SCGD). A purging device for purging atmospheric gases from a solution cathode glow discharge (SCGD) apparatus, comprising a hollow body that encloses a plasma generated between a solid anode and a solution cathode, wherein the body comprises at least one opening for release of water vapor generated by the plasma. A method for reducing matrix interferences from a SCGD comprising introducing an internal standard into a sample to be analyzed, wherein the sample comprises at least one element of interest; determining a spatial emission profile of the internal standard; using linear correlation between the spatial emission profile of the internal standard and the element of interest to predict a crossover point; and using the crossover point of the element of interest to select a vertical acquisition height for SCGD analysis.
    Type: Grant
    Filed: October 3, 2018
    Date of Patent: March 30, 2021
    Assignee: InnoTech Alberta Inc.
    Inventors: Stuart Garth Schroeder, Wade Joseph Hagman
  • Publication number: 20190101493
    Abstract: A device and method to reduce molecular background emission and to increase matrix management in solution cathode glow discharge (SCGD). A purging device for purging atmospheric gases from a solution cathode glow discharge (SCGD) apparatus, comprising a hollow body that encloses a plasma generated between a solid anode and a solution cathode, wherein the body comprises at least one opening for release of water vapor generated by the plasma. A method for reducing matrix interferences from a SCGD comprising introducing an internal standard into a sample to be analyzed, wherein the sample comprises at least one element of interest; determining a spatial emission profile of the internal standard; using linear correlation between the spatial emission profile of the internal standard and the element of interest to predict a crossover point; and using the crossover point of the element of interest to select a vertical acquisition height for SCGD analysis.
    Type: Application
    Filed: October 3, 2018
    Publication date: April 4, 2019
    Inventors: Stuart Garth SCHROEDER, Wade Joseph HAGMAN