Patents by Inventor Wah Yew Tan

Wah Yew Tan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of testing for power and ground continuity of a semiconductor device
    Patent number: 7279907
    Abstract: A method of testing for power and ground continuity of a semiconductor device having Input and Output (IO) pins and at least a pair of power and ground pins includes identifying the power and ground pins of the device. A victim pin is selected from the IO pins of the device for each pair of the power and ground pins, and an aggressor pin for each victim pin is selected from the remaining IO pins. The aggressor pins are toggled between a high state and a low state. A level of switching noise on each victim pin is measured, and the measured levels of switching noise are compared with predetermined data to determine power and ground continuity of the device.
    Type: Grant
    Filed: February 28, 2006
    Date of Patent: October 9, 2007
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Wai Khuin Phoon, Vivien Wong, Wah Yew Tan