Patents by Inventor Waheed Khan

Waheed Khan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High speed energy conserving scan architecture
    Publication number: 20060085707
    Abstract: A system comprising a tester and an integrated circuit, where the integrated circuit comprises a flip-flop, the flip-flop coupled to the tester and a circuit logic. The flip-flop comprises a scan input signal and a scan output signal, the signals coupled to the tester. The flip-flop also comprises multiple clock input signals.
    Type: Application
    Filed: September 28, 2004
    Publication date: April 20, 2006
    Applicant: Texas Instruments Incorporated
    Inventors: Waheed Khan, Raul Garibay, Denzil Fernandes
  • Diagnostic test kit
    Publication number: 20050227372
    Abstract: A diagnostic test kit comprising test strips, extraction instrument, reagent material, all in an elongated tubular container.
    Type: Application
    Filed: April 1, 2005
    Publication date: October 13, 2005
    Inventor: Waheed Khan