Patents by Inventor Wai Cheung Leung

Wai Cheung Leung has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6704435
    Abstract: A laser based inspection tool (LIT) for inspecting planar surfaces is described. In a preferred embodiment the LIT can simultaneously inspect both planar surfaces of disks for use in disk drives. In one embodiment of the invention, the incident beam is directed onto the surface to be inspected at an angle slightly offset from perpendicular so that the reflected beam is physically separated from the incident beam. The reflected beam is routed to a detector which converts the intensity of the reflected into an analog signal. The analog signal is sampled and digitized to generate pixel data stored in a buffer. Various analyses are performed on the data including calculating a rate of change in the pixel data. If the rate of change in the pixel data exceeds a selected threshold that indicates a possible defect if it occurs in the data area of the disk.
    Type: Grant
    Filed: April 28, 1997
    Date of Patent: March 9, 2004
    Assignee: International Business Machines Corporation
    Inventors: Wayne Isami Imaino, Anthony Juliana, Milton Russell Latta, Charles H. Lee, Wai Cheung Leung, Hal J. Rosen, Steven Meeks, Richard Sonningfeld
  • Patent number: 6624884
    Abstract: A laser based inspection tool (LIT) for inspecting planar surfaces is described. In a preferred embodiment the LIT can simultaneously inspect both planar surfaces of disks for use in disk drives. In an embodiment of the invention, light reflected from the surface at an angle slightly offset from perpendicular is routed through a telecentric lens to a detector which converts the intensity of the reflected beam into an analog signal. The analog signal is sampled and digitized to generate pixel data. A data acquisition system sequentially stores the pixel data in a buffer. A median filter and derivative analysis can be applied to the pixel data to detect deviations indicating defects. An optional calibration system periodically reflects the scanning beam back to a detector to form a reference signal for use in absolute reflectivity measurements.
    Type: Grant
    Filed: April 28, 1997
    Date of Patent: September 23, 2003
    Assignee: International Business Machines Corporation
    Inventors: Wayne Isami Imaino, Anthony Juliana, Jr., Milton Russell Latta, Charles H. Lee, Wai Cheung Leung, Hal J. Rosen, Steven Meeks, Richard Sonningfeld
  • Patent number: 6614519
    Abstract: An inspection system using laser light directed at an off-axis parabolic mirror which focuses the beam on the surface being inspected and also serves as the collector for scattered and specular light returned from the surface is described. Specular and scattered light returned from the surface onto the parabolic mirror is divided into appropriate fields and directed onto detectors. In the preferred embodiment a polarized laser is used in conjunction with a polarizing beam splitter and a quarter-wave plate to route the reflected beam to a detector while allowing the original beam to be directed through the same optics. The parabolic mirror and selected additional components may be commonly mounted on a translatable stage which is moved along a radius of the disk when the optical inspection is being performed. Other components of the system such as the laser can remain in a fixed position.
    Type: Grant
    Filed: October 25, 2000
    Date of Patent: September 2, 2003
    Assignee: International Business Machines Corporation
    Inventors: Milton Russell Latta, Wai Cheung Leung, Bob C. Robinson, Timothy Carl Strand, Andrew Ching Tam
  • Patent number: 6314814
    Abstract: A method and apparatus for precise measurement of pressure dependence of head fly height using transitional thermal signals is disclosed. A slider is positioned relative to a rotating a disk having at least one laser bump. Calibration data is gathered by decreasing the pressure and measuring the fly height until a contact positive TA signal is detected. A non-contact negative TA signal is then normalized using the gathered calibration data. The TA signal amplitude may then be used to ascertain the fly height and pressure for a head.
    Type: Grant
    Filed: March 1, 2000
    Date of Patent: November 13, 2001
    Assignee: International Business Machines Corporation
    Inventors: James Hammond Brannon, Shanlin Duan, Wai Cheung Leung, Yan Liu, Li Tang
  • Patent number: 6117620
    Abstract: A method of making a calibration disk for a laser based inspection tool (LIT) for inspecting planar surfaces is described. The calibration disk has a plurality of overlapping bumps forming a circular ring with a width of one bump. The circular ring of bumps forms a feature of a known width and position on a disk which can be used to adjust one or more LIT's to yield calibrated results. The ring of overlapping bumps is preferably formed by rotating a disk substrate under a stationary pulsing laser beam.
    Type: Grant
    Filed: December 4, 1998
    Date of Patent: September 12, 2000
    Assignee: International Business Machines Corporation
    Inventors: Wayne Isami Imaino, Anthony Juliana, Jr., Milton Russell Latta, Charles H. Lee, Wai Cheung Leung, Hal J. Rosen, James Hammond Brannon
  • Patent number: 6100971
    Abstract: A laser based inspection tool (LIT) for inspecting planar surfaces is described. In a preferred embodiment the LIT can simultaneously inspect both planar surfaces of disks for use in disk drives. In an embodiment of the invention, the incident beam is directed onto the surface to be inspected at an angle slightly offset from perpendicular so that the reflected beam is physically separated from the incident beam. Although slightly offset the reflected beam is routed back through the telecentric lens and scanner which are used for the incident beam. Preferably an aperture mask is placed in the path of the reflected beam and the incident beam to limit the cone of scattered light. Since the incident and reflected beams are physically separated, there may be an aperture for each beam, but the two masks may be physically connected. The aperture masks may also be used for alignment adjustments of the beams.
    Type: Grant
    Filed: April 28, 1997
    Date of Patent: August 8, 2000
    Assignee: International Business Machines Corporation
    Inventors: Wayne Isami Imaino, Anthony Juliana, Jr., Milton Russell Latta, Charles H. Lee, Wai Cheung Leung, Hal J. Rosen
  • Patent number: 5969370
    Abstract: A laser based inspection tool (LIT) for inspecting planar surfaces is described. In a preferred embodiment the LIT can simultaneously inspect both planar surfaces of disks for use in disk drives. In one embodiment of the invention, a disk is moved into an inspection subcompartment between a pair of air knives which blow partially ionized air onto the planar sides of the disk to remove loose particles adhering thereto. After the disk moves through the air knife streams, the two laser beams scan the two sides of the disk. Preferably the scan occurs after the air knives have been turned off and as the disk moves out of the inspection subcompartment. The subcompartment may optionally have an air source which forces air to flow out of the subcompartment to aid in maintaining a clean environment for inspection.
    Type: Grant
    Filed: April 28, 1997
    Date of Patent: October 19, 1999
    Assignee: International Business Machines Corporation
    Inventors: Wayne Isami Imaino, Anthony Juliana, Jr., Milton Russell Latta, Charles H. Lee, Wai Cheung Leung, Hal J. Rosen
  • Patent number: 5945685
    Abstract: A glass disk substrate inspection tool uses a polarized laser beam that is directed to the first surface of the disk substrate at Brewster's angle and is then transmitted through the disk substrate to a light detector that generates a signal representative of the intensity of the light received. Because the light polarized parallel to the plane of incidence, i.e., the plane formed by the line of the incident beam and a line perpendicular to the surface of the disk substrate, is completely transmitted, there is no surface reflection at either the first or second surfaces of the disk substrate. The polarized beam is directed by a first rotating scanner to the input of a telecentric lens assembly that provides an output beam parallel to its optical axis as the beam is being scanned. The beam is then directed by a first fixed mirror to strike the first surface of the disk substrate at Brewster's angle as the beam is scanned along a line across the first disk surface.
    Type: Grant
    Filed: November 19, 1997
    Date of Patent: August 31, 1999
    Assignee: International Business Machines Corporation
    Inventors: Wayne Isami Imaino, Anthony Juliana, Jr., Milton Russell Latta, Charles Cheng-Hsing Lee, Wai Cheung Leung, Hal Jervis Rosen
  • Patent number: 5933230
    Abstract: A laser based inspection tool (LIT) for inspecting planar surfaces is described. In a preferred embodiment the LIT can simultaneously inspect both planar surfaces of disks for use in disk drives. The choice of a polygon scanner is preferred, but other scanning means such as a galvonometer mirror could be used. A separate polygon scanner is used for each side of the disk. The polygons are arranged in a common plane, but rotate in opposite directions to reduce the inteference which might otherwise result when the beams pass through the central hole in the disk and impinge on the detection channel for the other side. Preferably the rotation of the polygons is synchonized and angularly offset so that the two beams are synchonized and offset.
    Type: Grant
    Filed: April 28, 1997
    Date of Patent: August 3, 1999
    Assignee: International Business Machines Corporation
    Inventors: Wayne Isami Imaino, Anthony Juliana, Jr., Milton Russell Latta, Charles H. Lee, Wai Cheung Leung, Hal J. Rosen
  • Patent number: 5917589
    Abstract: A laser based inspection tool (LIT) for inspecting planar surfaces is described. In a preferred embodiment the LIT can simultaneously inspect both planar surfaces of disks for use in disk drives. The LIT uses a mechanical lifter which moves the disk through the laser scan lines (i.e. perpendicular to the scan lines) to allow the entire surface on each side of the disk to be scanned. The light reflected from the surface is routed to a detector which converts the intensity of the reflected beam into an analog signal. The analog signal is sampled and digitized to generate pixel data. A data acquisition system sequentially stores the pixel data in a buffer. The edges of the planar surface in the pixel data are determined for each scan line while data acquisition is in progress. A mask is applied to direct the defect detection only to meaningful areas of the disk while data acquisition is in progress. A median filter and derivative analysis can be applied to the pixel data to detect deviations indicating defects.
    Type: Grant
    Filed: April 28, 1997
    Date of Patent: June 29, 1999
    Assignee: International Business Machines Corporation
    Inventors: Wayne Isami Imaino, Anthony Juliana, Jr., Milton Russell Latta, Charles H. Lee, Wai Cheung Leung, Hal J. Rosen
  • Patent number: 5867261
    Abstract: A laser based inspection tool (LIT) for inspecting planar surfaces is described. In a preferred embodiment the LIT can simultaneously inspect both planar surfaces of disks for use in disk drives. The LIT uses a mechanical lifter which moves the disk through the laser scan lines (i.e. perpendicular to the scan lines) to allow the entire surface on each side of the disk to be scanned. The light reflected from the surface is routed to a detector which converts the intensity of the reflected beam into an analog signal. The analog signal is sampled and digitized to generate pixel data. A data acquisition system sequentially stores the pixel data in a buffer. The edges of the planar surface in the pixel data are determined for each scan line while data acquisition is in progress. A mask is applied to direct the defect detection only to meaningful areas of the disk while data acquisition is in progress. A median filter and derivative analysis can be applied to the pixel data to detect deviations indicating defects.
    Type: Grant
    Filed: April 28, 1997
    Date of Patent: February 2, 1999
    Assignee: International Business Machines Corporation
    Inventors: Wayne Isami Imaino, Anthony Juliana, Jr., Milton Russell Latta, Charles H. Lee, Wai Cheung Leung, Hal J. Rosen
  • Patent number: 5847823
    Abstract: A calibration disk for a laser based inspection tool (LIT) for inspecting planar surfaces is described. The calibration disk has a plurality of overlapping bumps forming a circular ring with a width of one bump. The circular ring of bumps forms a feature of a known width and position on a disk which can be used to adjust one or more LIT's to yield calibrated results.
    Type: Grant
    Filed: April 28, 1997
    Date of Patent: December 8, 1998
    Assignee: International Business Machines Corporation
    Inventors: Wayne Isami Imaino, Anthony Juliana, Jr., Milton Russell Latta, Charles H. Lee, Wai Cheung Leung, Hal J. Rosen, James Hammond Brannon