Patents by Inventor Wai Keung Fung

Wai Keung Fung has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6862924
    Abstract: An improved method is provided for performing nanomanipulations using an atomic force microscope. The method includes: performing a nanomanipulation operation on a sample surface using an atomic force microscope; determining force data for forces that are being applied to the tip of the cantilever during the nanomanipulation operation, where the force data is derived along at least two perpendicularly arranged axis; and updating a model which represents the topography of the sample surface using the force data.
    Type: Grant
    Filed: May 2, 2003
    Date of Patent: March 8, 2005
    Assignee: Board of Trustees operating Michigan State University
    Inventors: Ning Xi, Wai Keung Fung, Mengmeng Yu, Guangyong Li
  • Publication number: 20040216517
    Abstract: An improved method is provided for performing nanomanipulations using an atomic force microscope. The method includes: performing a nanomanipulation operation on a sample surface using an atomic force microscope; determining force data for forces that are being applied to the tip of the cantilever during the nanomanipulation operation, where the force data is derived along at least two perpendicularly arranged axis; and updating a model which represents the topography of the sample surface using the force data.
    Type: Application
    Filed: May 2, 2003
    Publication date: November 4, 2004
    Inventors: Ning Xi, Wai Keung Fung, Mengmeng Yu, Guangyong Li