Abstract: A method, device and system for detecting error correction defects calculates a written error checking and correction (ECC) code for a written data and writes the written data and the written ECC code into a plurality of memory cells. When data is read from the memory cells including data representing ECC code, any errors are identified in the data from the ECC code. When the quantity of errors exceeds the correctable quantity supported by the ECC code, then the data is output “as-is” without attempts to correct the data or fail the memory device if the memory device is under test.

Abstract: A method, device and system for detecting error correction defects calculates a written error checking and correction (ECC) code for a written data and writes the written data and the written ECC code into a plurality of memory cells. When data is read from the memory cells including data representing ECC code, any errors are identified in the data from the ECC code. When the quantity of errors exceeds the correctable quantity supported by the ECC code, then the data is output “as-is” without attempts to correct the data or fail the memory device if the memory device is under test.