Patents by Inventor WAI LIK WILLIAM WONG

WAI LIK WILLIAM WONG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Sensor and method for determining a fabric type
    Patent number: 10132026
    Abstract: The invention relates to a fabric sensor (1) for determining a fabric type. The fabric sensor (1) comprises a first structural component (2) comprising a first sensing surface (3), and a second structural component (4) comprising a second sensing surface (5). The first structural component (2) and the second structural component (4) are movable relative to each other to form a closed arrangement wherein the first sensing surface (3) and the second sensing surface (5) hold the fabric. The fabric sensor (1) also comprises a thickness measurement mechanism (6) for measuring a thickness of the fabric when the fabric is held between the first sensing surface (3) and the second sensing surface (5). The fabric sensor (1) also comprises a processing unit (7) coupled to the thickness measurement mechanism (6) and at least one of the first sensing surface (3) and the second sensing surface (5).
    Type: Grant
    Filed: November 28, 2016
    Date of Patent: November 20, 2018
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Mohankumar Valiyambath Krishnan, Linfang Xu, Wai Lik William Wong
  • SENSOR AND METHOD FOR DETERMINING A FABRIC TYPE
    Publication number: 20180258580
    Abstract: The invention relates to a fabric sensor (1) for determining a fabric type. The fabric sensor (1) comprises a first structural component (2) comprising a first sensing surface (3), and a second structural component (4) comprising a second sensing surface (5). The first structural component (2) and the second structural component (4) are movable relative to each other to form a closed arrangement wherein the first sensing surface (3) and the second sensing surface (5) hold the fabric. The fabric sensor (1) also comprises a thickness measurement mechanism (6) for measuring a thickness of the fabric when the fabric is held between the first sensing surface (3) and the second sensing surface (5). The fabric sensor (1) also comprises a processing unit (7) coupled to the thickness measurement mechanism (6) and at least one of the first sensing surface (3) and the second sensing surface (5).
    Type: Application
    Filed: November 28, 2016
    Publication date: September 13, 2018
    Inventors: MOHANKUMAR VLIYAMBATH KRISHNAN, LINFANG XU, WAI LIK WILLIAM WONG