Abstract: A method of testing for power and ground continuity of a semiconductor device having Input and Output (IO) pins and at least a pair of power and ground pins includes identifying the power and ground pins of the device. A victim pin is selected from the IO pins of the device for each pair of the power and ground pins, and an aggressor pin for each victim pin is selected from the remaining IO pins. The aggressor pins are toggled between a high state and a low state. A level of switching noise on each victim pin is measured, and the measured levels of switching noise are compared with predetermined data to determine power and ground continuity of the device.

Abstract: A load board includes an embedded relay tracker circuit that counts and stores relay clicks to measure relay usage. Having accurate relay usage data reduces maintenance costs. The relay tracker circuit includes a controller with a counter for counting relay clicks of the load board relays and wires or conductive traces connecting the controller to the relays. Each time a relay switches, a signal is transmitted from the relay to the controller and the controller increments the counter. The count information then is stored in a memory connected to the counter.